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Paper Integrity Record · LEDGER

Dual-Material Double-Gate Source-Pocket Tunnel Field Effect Transistor with Homogeneous Gate Dielectric: Computational Analysis of Structural and Material Parameters for Enhanced Performance

As of an unrecorded date, Pith completed 0 of 0 listed checks against arXiv:2506.08556. No listed check completed, so this record makes no findings claim.

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pith.integrity.v1
2506.08556 v1
pith:2025:CYQYI6IZG6FQOH5R2AVRKQZL7P

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