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UniEM-3M: A Universal Electron Micrograph Dataset for Microstructural Segmentation and Generation

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arxiv 2508.16239 v1 pith:PCQDTSBJ submitted 2025-08-22 cs.CV

UniEM-3M: A Universal Electron Micrograph Dataset for Microstructural Segmentation and Generation

classification cs.CV
keywords modelbenchmarkdatasetsegmentationuniem-3mavailablecharacterizationcomplete
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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Quantitative microstructural characterization is fundamental to materials science, where electron micrograph (EM) provides indispensable high-resolution insights. However, progress in deep learning-based EM characterization has been hampered by the scarcity of large-scale, diverse, and expert-annotated datasets, due to acquisition costs, privacy concerns, and annotation complexity. To address this issue, we introduce UniEM-3M, the first large-scale and multimodal EM dataset for instance-level understanding. It comprises 5,091 high-resolution EMs, about 3 million instance segmentation labels, and image-level attribute-disentangled textual descriptions, a subset of which will be made publicly available. Furthermore, we are also releasing a text-to-image diffusion model trained on the entire collection to serve as both a powerful data augmentation tool and a proxy for the complete data distribution. To establish a rigorous benchmark, we evaluate various representative instance segmentation methods on the complete UniEM-3M and present UniEM-Net as a strong baseline model. Quantitative experiments demonstrate that this flow-based model outperforms other advanced methods on this challenging benchmark. Our multifaceted release of a partial dataset, a generative model, and a comprehensive benchmark -- available at huggingface -- will significantly accelerate progress in automated materials analysis.

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