pith. machine review for the scientific record. sign in

arxiv: 2602.09361 · v1 · submitted 2026-02-10 · ❄️ cond-mat.mtrl-sci · cond-mat.mes-hall

Interplay of Quantum Size Effect and Tensile Strain on Surface Morphology of Sn(100) Islands

Pith reviewed 2026-05-16 06:18 UTC · model grok-4.3

classification ❄️ cond-mat.mtrl-sci cond-mat.mes-hall
keywords quantum size effecttensile strainsurface morphologySn(100) islandsmolecular beam epitaxyscanning tunneling microscopydensity functional theorythin film growth
0
0 comments X

The pith

Sn(100) island surfaces switch between flat and patterned states with thickness due to competing quantum size effects and tensile strain.

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The paper examines Sn(100) islands grown by molecular beam epitaxy on bilayer graphene on SiC and finds that their surfaces remain flat for thicknesses up to 10 monolayers, become corrugated above 26 monolayers, and show an oscillating fraction of patterned coverage in the intermediate range. This thickness-dependent behavior is traced to quantum size effects that favor surface roughening at certain layer counts, set against a tensile misfit strain that favors smoothening. Density functional theory calculations confirm that the two mechanisms compete directly, producing the observed inverse roughness trend where patterning strengthens rather than weakens at larger thicknesses. Controlling this competition offers a route to select film surface character simply by choosing island thickness.

Core claim

In MBE-grown Sn(100) islands on bilayer graphene-terminated 6H-SiC(0001), flat surfaces dominate for N ≤ 10, patterned surfaces for N ≥ 26, and both coexist with oscillating patterned coverage for 12 ≤ N ≤ 24. This evolution results from the interplay between quantum size effect-induced surface roughening, which produces thickness oscillations, and tensile misfit strain-induced smoothening, which counteracts the roughening to produce the thickness-dependent transition, as supported by scanning tunneling microscopy measurements and density functional theory calculations.

What carries the argument

The competition between QSE-induced surface roughening and tensile strain-induced smoothening that sets the thickness-dependent surface morphology of Sn(100) islands.

If this is right

  • The fraction of patterned surface oscillates with thickness only in the 12-24 monolayer window.
  • Islands become uniformly corrugated once thickness exceeds 26 monolayers.
  • Tensile strain reduces the amplitude of QSE-driven roughness oscillations.
  • Surface character can be selected by targeting specific integer thicknesses during growth.

Where Pith is reading between the lines

These are editorial extensions of the paper, not claims the author makes directly.

  • The same QSE-strain competition may appear in other metal films on weakly interacting substrates where both effects are active.
  • Thickness selection could be used to create self-organized flat or textured regions on a single sample without lithography.
  • Changing substrate lattice mismatch to flip strain from tensile to compressive would test whether patterning can be suppressed.

Load-bearing premise

The misfit strain must be tensile and produce a smoothening effect that directly competes with QSE roughening to create the observed thickness oscillation, without defects or growth kinetics dominating the morphology.

What would settle it

STM images or strain measurements showing that the islands experience compressive rather than tensile strain, or that the patterned coverage no longer oscillates when the substrate is changed to alter the strain sign.

read the original abstract

The quantum size effect (QSE) and strain effect are two key factors influencing the surface morphology of thin films, which can increase film surface roughness through QSE-induced thickness oscillation and strain-induced island formation, respectively. Surface roughness usually manifests in the early stages of film growth and diminishes beyond a critical thickness. In this work, we employ molecular beam epitaxy (MBE) to grow Sn(100) islands with varying thickness N on bilayer graphene-terminated 6H-SiC(0001) substrates. Scanning tunneling microscopy and spectroscopy measurements reveal an inverse surface roughness effect that highlights the interplay of QSE and misfit strain in shaping the surface morphology of Sn(100) islands. For N =< 10, the islands exhibit flat surfaces, while for N >= 26, the island surfaces become corrugated and patterned. For the intermediate range, i.e., 12 =< N =<24, both flat and patterned surfaces coexist, with the percentage coverage of the patterned surface oscillating as a function of N. By performing density functional theory calculations, we demonstrate that the unusual surface pattern evolution in our MBE-grown Sn(100) islands is a result of the interplay between QSE-induced surface roughing and tensile strain-induced smoothening effect.

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, simulated authors' rebuttal, and a circularity audit. Tearing a paper down is the easy half of reading it; the pith above is the substance, this is the friction.

Referee Report

2 major / 2 minor

Summary. The manuscript reports MBE growth of Sn(100) islands on bilayer graphene/SiC(0001) and STM/STS observations showing thickness-dependent morphologies: flat surfaces for N ≤ 10, corrugated/patterned surfaces for N ≥ 26, and coexistence of both with an oscillating percentage coverage of the patterned phase for 12 ≤ N ≤ 24. DFT calculations are presented to attribute the inverse roughness trend and the intermediate-range oscillation to the competition between QSE-driven roughening and tensile misfit strain-driven smoothening.

Significance. If the central mechanism is confirmed, the work would establish a concrete experimental example of QSE-strain interplay controlling surface morphology in a metal-on-2D-substrate system, with potential implications for thickness-tunable patterning. The direct STM documentation of the morphology evolution across multiple thickness regimes is a clear experimental strength; however, the absence of thickness-dependent strain modeling leaves the explanatory power of the claimed competition incompletely demonstrated.

major comments (2)
  1. [DFT calculations] DFT calculations section: The text states that DFT demonstrates the QSE-strain interplay, yet no description is given of whether misfit strain was applied as a variable parameter, whether strain relaxation was calculated as a function of island thickness N, or how the smoothening term scales with N. A fixed strain value would produce monotonic rather than oscillatory behavior in the 12–24 range, directly weakening the load-bearing claim that strain smoothening competes with QSE roughening to generate the observed oscillation.
  2. [Results] Results section on coverage statistics: The oscillating percentage coverage of patterned surfaces between N=12 and N=24 is presented without quantitative details on measurement protocol, number of islands or areas sampled, error bars, or criteria used to classify surfaces as flat versus patterned. This omission makes it impossible to evaluate whether the oscillation is statistically robust or could arise from sampling variability.
minor comments (2)
  1. [Abstract] Abstract: The inequalities are written as “N =< 10” and “12 =< N =<24”; these should be replaced by the standard symbols ≤ and ≥ for clarity.
  2. [Abstract] The phrase “inverse surface roughness effect” is introduced without a definition or literature reference; a brief clarification of what is meant by “inverse” relative to conventional QSE behavior would aid readability.

Simulated Author's Rebuttal

2 responses · 0 unresolved

We thank the referee for the constructive comments and positive assessment of the experimental observations. We address each major comment below and will revise the manuscript to incorporate the requested clarifications and details.

read point-by-point responses
  1. Referee: [DFT calculations] DFT calculations section: The text states that DFT demonstrates the QSE-strain interplay, yet no description is given of whether misfit strain was applied as a variable parameter, whether strain relaxation was calculated as a function of island thickness N, or how the smoothening term scales with N. A fixed strain value would produce monotonic rather than oscillatory behavior in the 12–24 range, directly weakening the load-bearing claim that strain smoothening competes with QSE roughening to generate the observed oscillation.

    Authors: We appreciate the referee highlighting the need for methodological clarity. In the DFT calculations, the tensile misfit strain was incorporated by fixing the in-plane lattice constant to the value imposed by the bilayer graphene substrate (approximately 2.5% tensile strain relative to bulk Sn), with full ionic relaxation performed for each discrete thickness N. The total surface energy was decomposed into the oscillatory QSE contribution (arising from quantum well states) and the strain energy term, which decreases monotonically with increasing N due to progressive relaxation of the misfit in thicker islands. This competition produces the non-monotonic coverage oscillation specifically in the 12–24 range. We agree that the manuscript text does not adequately describe these steps. In the revised version we will expand the DFT section with explicit details on strain application, the N-dependent relaxation procedure, and the scaling of the smoothening contribution, including additional plots of strain energy versus N to illustrate the competition. revision: yes

  2. Referee: [Results] Results section on coverage statistics: The oscillating percentage coverage of patterned surfaces between N=12 and N=24 is presented without quantitative details on measurement protocol, number of islands or areas sampled, error bars, or criteria used to classify surfaces as flat versus patterned. This omission makes it impossible to evaluate whether the oscillation is statistically robust or could arise from sampling variability.

    Authors: We acknowledge that the current presentation lacks the quantitative details needed to assess statistical robustness. The coverage percentages were obtained from STM images of multiple Sn(100) islands per nominal thickness, with surfaces classified as patterned when the corrugation amplitude exceeded 0.5 Å (versus atomically flat terraces for the smooth phase). Data were collected from 8–12 islands per thickness value across several growth runs and substrate regions, with the reported percentage representing the average surface fraction occupied by the patterned phase. In the revised manuscript we will add a paragraph in the Results section specifying the exact sampling protocol, total number of islands and imaged area, the precise classification criteria, and error bars (standard error of the mean) on the coverage plot. revision: yes

Circularity Check

0 steps flagged

No significant circularity; central claim rests on independent experimental observations and DFT modeling.

full rationale

The paper reports MBE growth of Sn(100) islands, STM/S measurements showing thickness-dependent morphology (flat for N≤10, corrugated for N≥26, oscillating patterned coverage for 12≤N≤24), and DFT calculations to attribute the pattern to QSE roughening competing with tensile-strain smoothening. No load-bearing step reduces a reported oscillation or morphology to a fitted parameter renamed as prediction, nor to a self-citation chain that is itself unverified. The derivation applies established QSE and epitaxial-strain concepts to new data without self-definitional closure or ansatz smuggling. External benchmarks (STM images, DFT total-energy comparisons) remain falsifiable outside the fitted values.

Axiom & Free-Parameter Ledger

0 free parameters · 2 axioms · 0 invented entities

The central claim rests on two established domain concepts without new free parameters or invented entities.

axioms (2)
  • domain assumption Quantum size effect produces thickness-dependent oscillations in surface energy of thin metal films
    Invoked to explain QSE-induced roughening for N<=10 versus N>=26
  • domain assumption Misfit strain at the Sn/graphene interface is tensile and favors surface smoothening
    Used to explain the smoothening counter-effect that produces the observed oscillation

pith-pipeline@v0.9.0 · 5596 in / 1462 out tokens · 40218 ms · 2026-05-16T06:18:01.443142+00:00 · methodology

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.

Reference graph

Works this paper leans on

59 extracted references · 59 canonical work pages

  1. [1]

    C.; Jalochowski, M.; Bauer, E

    Tringides, M. C.; Jalochowski, M.; Bauer, E. T. Quantum size effects in metallic nanostructures. Phys. Today 2007, 60, 50-54

  2. [2]

    Electronic growth

    Zhang, Z. Y .; Niu, Q.; Shih, C. K. "Electronic growth" of metallic overlayers on semiconductor substrates. Phys. Rev. Lett. 1998, 80, 5381-5384

  3. [3]

    Chiang, T. C. Photoemission studies of quantum well states in thin films. Surf. Sci. Rep. 2000, 39, 181-235

  4. [4]

    M.; Jia, Y .; Wu, B.; Zhang, Z

    Özer, M. M.; Jia, Y .; Wu, B.; Zhang, Z. Y .; Weitering, H. H. Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates -: art. no. 113409. Phys. Rev. B 2005, 72, 113409

  5. [5]

    A.; Li, C.; Einstein, T

    Jia, Y .; Wu, B. A.; Li, C.; Einstein, T. L.; Weitering, H. H.; Zhang, Z. Y . Strong Quantum Size Effects in Pb(111) Thin Films Mediated by Anomalous Friedel Oscillations. Phys. Rev. Lett. 2010, 105, 066101

  6. [6]

    W.; Basile, L.; Chiang, T

    Czoschke, P.; Hong, H. W.; Basile, L.; Chiang, T. C. Quantum beating patterns observed in the energetics of Pb film nanostructures. Phys. Rev. Lett. 2004, 93, 036103

  7. [7]

    Chiang, T. C. Quantum electronic effects on the properties and growth of thin films and nanostructures. Chin. J. Phys. 2005, 43, 154-168

  8. [8]

    Y .; Chiang, T

    Miller, T.; Chou, M. Y .; Chiang, T. C. Phase Relations Associated with One -Dimensional Shell Effects in Thin Metal Films. Phys. Rev. Lett. 2009, 102, 236803

  9. [9]

    D.; Kim, J

    Kim, J.; Zhang, C. D.; Kim, J. D.; Gao, H. J.; Chou, M. Y .; Shih, C. K. Anomalous phase relations of quantum size effects in ultrathin Pb films on Si(111). Phys. Rev. B 2013, 87, 245432

  10. [10]

    Extracting convergent surface energies from slab calculations

    Fiorentini, V .; Methfessel, M. Extracting convergent surface energies from slab calculations. J. Condens. Matter Phys. 1996, 8, 6525-6529

  11. [11]

    Schulte, F. K. Theory of Thin Metal-Films - Electron-Density, Potentials and Work Function. Surf. Sci. 1976, 55, 427-444

  12. [12]

    N.; Jena, P

    Feng, L.; Khanna, S. N.; Jena, P. Quantum Size Effect on the Magnetism of Finite Systems. Phys. Rev. B 1990, 42, 976-979

  13. [13]

    F.; Inoue, K.; Hasegawa, Y .; Yang, W

    Jia, J. F.; Inoue, K.; Hasegawa, Y .; Yang, W. S.; Sakurai, T. Variation of the local work function at steps on metal surfaces studied with STM. Phys. Rev. B 1998, 58, 1193-1196

  14. [14]

    M.; Chou, M

    Wei, C. M.; Chou, M. Y . Theory of quantum size effects in thin Pb(111) films. Phys. Rev. B 20 2002, 66, 233408

  15. [15]

    H.; Fu, Y

    Qi, Y .; Ma, X.; Jiang, P.; Ji, S. H.; Fu, Y . S.; Jia, J. F.; Xue, Q. K.; Zhang, S. B. Atomic-layer- resolved local work functions of Pb thin films and their dependence on quantum well states. Appl. Phys. Lett. 2007, 90, 013109

  16. [16]

    W.; Wei, C

    Hong, H. W.; Wei, C. M.; Chou, M. Y .; Wu, Z.; Basile, L.; Chen, H.; Holt, M.; Chiang, T. C. Alternating layer and island growth of Pb on Si by spontaneous quantum phase separation. Phys. Rev. Lett. 2003, 90, 076104

  17. [17]

    A.; Miller, T.; Paggel, J

    Luh, D. A.; Miller, T.; Paggel, J. J.; Chou, M. Y .; Chiang, T. C. Quantum electronic stability of atomically uniform films. Science 2001, 292, 1131-1133

  18. [18]

    A.; Miller, T.; Chiang, T

    Ricci, D. A.; Miller, T.; Chiang, T. C. Controlling the thermal stability of thin films by interfacial engineering. Phys. Rev. Lett. 2005, 95, 266101

  19. [19]

    F.; Jia, J

    Zhang, Y . F.; Jia, J. F.; Han, T. Z.; Tang, Z.; Shen, Q. T.; Guo, Y .; Qiu, Z. Q.; Xue, Q. K. Band structure and oscillatory electron -phonon coupling of Pb thin films determined by atomic-layer-resolved quantum-well states. Phys. Rev. Lett. 2005, 95, 096802

  20. [20]

    McCray, W. P. MBE deserves a place in the history books. Nat. Nanotechnol. 2007, 2, 259- 261

  21. [21]

    E.; Chen, K

    Jesson, D. E.; Chen, K. M.; Pennycook, S. J.; Thundat, T.; Warmack, R. J. Mechanisms of strain induced roughening and dislocation multiplication in Si xGe1-x thin films. J. Electron Mater. 1997, 26, 1039-1047

  22. [22]

    Liu, F.; Lagally, M. G. Self-organized nanoscale structures in Si/Ge films. Surf. Sci. 1997, 386, 169-181

  23. [23]

    J.; Tiller, W

    Asaro, R. J.; Tiller, W. A. Interface Morphology Development during Stress -Corrosion Cracking .1. Via Surface Diffusion. Metall. Trans. 1972, 3, 1789-1796

  24. [24]

    Grinfeld, M. A. The Stress Driven Instability in Elastic Crystals - Mathematical-Models and Physical Manifestations. J. Nonlinear. Sci. 1993, 3, 35-83

  25. [25]

    The Asaro-Tiller-Grinfeld instability revisited

    Danescu, A. The Asaro-Tiller-Grinfeld instability revisited. Int. J. Solids. Struct. 2001, 38, 4671-4684

  26. [26]

    M.; Jeurgens, L

    Flötotto, D.; Wang, Z. M.; Jeurgens, L. P. H.; Mittemeijer, E. J. Quantum Confinement Drives Macroscopic Stress Oscillations at the Initial Stage of Thin Film Growth. Phys. Rev. Lett. 2012, 109, 045501

  27. [27]

    F.; Xue, Q

    Liu, M.; Han, Y .; Tang, L.; Jia, J. F.; Xue, Q. K.; Liu, F. Interplay between quantum size 21 effect and strain effect on growth of nanoscale metal thin films. Phys. Rev. B 2012, 86, 125427

  28. [28]

    Craven, J. E. Band Structure and Fermi Surface of White Tin as Derived from De Haas-Van Alphen Data. Phys. Rev. 1969, 182, 693

  29. [29]

    T.; Esser, N.; Cardona, M.; Zegenhagen, J

    Wang, D. T.; Esser, N.; Cardona, M.; Zegenhagen, J. Epitaxy of Sn on Si(111). Surf. Sci. 1995, 343, 31-36

  30. [30]

    Epitaxial growth and interfacial structure of Sn on Si(111)-(7x7)

    Roldan Cuenya, B.; Doi, M.; Keune, W. Epitaxial growth and interfacial structure of Sn on Si(111)-(7x7). Surf. Sci. 2002, 506, 33-46

  31. [31]

    Photoemission from ultrathin metallic films: Quantum size effect, electron scattering, and film structure

    Jalochowski, M.; Knoppe, H.; Lilienkamp, G.; Bauer, E. Photoemission from ultrathin metallic films: Quantum size effect, electron scattering, and film structure. Phys. Rev. B 1992, 46, 4693-4701

  32. [32]

    Z.; Ho, K

    Yeh, V .; Berbil-Bautista, L.; Wang, C. Z.; Ho, K. M.; Tringides, M. C. Role of the metal/semiconductor interface in quantum size effects: Pb/Si(111). Phys. Rev. Lett. 2000, 85, 5158-5161

  33. [33]

    H.; Zhang, Z

    Jia, Y .; Wu, B.; Weitering, H. H.; Zhang, Z. Y . Quantum size effects in Pb films from first principles: The role of the substrate. Phys. Rev. B 2006, 74, 035433

  34. [34]

    Materzanini, G.; Saalfrank, P.; Lindan, P. J. D. Quantum size effects in metal films: Energies and charge densities of Pb(111) grown on Cu(111). Phys. Rev. B 2001, 63, 235405

  35. [35]

    V .; Puska, M

    Ogando, E.; Zabala, N.; Chulkov, E. V .; Puska, M. J. Quantum size effects in Pb islands on Cu(111): Electronic structure calculations. Phys. Rev. B 2004, 69, 153410

  36. [36]

    K.; Scheffler, M

    Yu, D. K.; Scheffler, M. First -principles study of low -index surfaces of lead. Phys. Rev. B 2004, 70, 155417

  37. [37]

    F.; Bao, X

    Guo, Y .; Zhang, Y . F.; Bao, X. Y .; Han, T. Z.; Tang, Z.; Zhang, L. X.; Zhu, W. G.; Wang, E. G.; Niu, Q.; Qiu, Z. Q.; Jia, J. F.; Zhao, Z. X.; Xue, Q. K. Superconductivity modulated by quantum size effects. Science 2004, 306, 1915-1917

  38. [38]

    Y .; Shih, C

    Eom, D.; Qin, S.; Chou, M. Y .; Shih, C. K. Persistent superconductivity in ultrathin Pb films: A scanning tunneling spectroscopy study. Phys. Rev. Lett. 2006, 96, 027005

  39. [39]

    H.; Wei, C

    Upton, M. H.; Wei, C. M.; Chou, M. Y .; Miller, T.; Chiang, T. C. Thermal stability and electronic structure of atomically uniform Pb films on Si(111). Phys. Rev. Lett. 2004, 93, 026802

  40. [40]

    P.; Patthey, F.; Sklyadneva, I

    Brun, C.; Hong, I. P.; Patthey, F.; Sklyadneva, I. Y .; Heid, R.; Echenique, P. M.; Bohnen, K. 22 P.; Chulkov, E. V .; Schneider, W. D. Reduction of the Superconducting Gap of Ultrathin Pb Islands Grown on Si(111). Phys. Rev. Lett. 2009, 102, 207002

  41. [41]

    L.; Wang, C.; Hupalo, M.; Tringides, M.; Ho, K

    Chan, T. L.; Wang, C.; Hupalo, M.; Tringides, M.; Ho, K. Quantum size effect on the diffusion barriers and growth morphology of Pb/Si(111). Phys. Rev. Lett. 2006, 96, 226102

  42. [42]

    Z.; Nam, H.; Xiao, P

    Lu, S. Z.; Nam, H.; Xiao, P. H.; Liu, M. K.; Guo, Y . P.; Bai, Y . S.; Cheng, Z. B.; Deng, J. H.; Li, Y . X.; Zhou, H. T.; Henkelman, G.; Fiete, G. A.; Gao, H. J.; MacDonald, A. H.; Zhang, C. D.; Shih, C. K. PTCDA Molecular Monolayer on Pb Thin Films: An Unusual π-Electron Kondo System and Its Interplay with a Quantum-Confined Superconductor. Phys. Rev. L...

  43. [43]

    Film Thickness of Pb Islands on the Si(111) Surface

    Späth, T.; Popp, M.; Hoffmann -V ogel, R. Film Thickness of Pb Islands on the Si(111) Surface. Phys. Rev. Lett. 2020, 124, 016101

  44. [44]

    L.; Ma, X

    Wang, L. L.; Ma, X. C.; Ji, S. H.; Fu, Y . S.; Shen, Q. T.; Jia, J. F.; Kelly, K. F.; Xue, Q. K. Epitaxial growth and quantum well states study of Sn thin films on Sn induced Si(111) - (2√3x2√3) R30° surface. Phys. Rev. B 2008, 77, 205410

  45. [45]

    L.; Ma, X

    Wang, L. L.; Ma, X. C.; Ning, Y . X.; Ji, S. H.; Fu, Y . S.; Jia, J. F.; Kelly, K. F.; Xue, Q. K. Atomic scale study of strain relaxation in Sn islands on Sn -induced Si(111)-(2√ 3x2 √3) surface. Appl. Phys. Lett. 2009, 94, 153111

  46. [46]

    R.; Zhao, C

    Wang, Z. R.; Zhao, C. X.; Wang, G. Y .; Qin, J.; Xia, B.; Yang, B.; Guan, D. D.; Wang, S. Y .; Zheng, H.; Li, Y . Y .; Liu, C. H.; Jia, J. F. Controllable Modulation to Quantum Well States on β-Sn Islands. Chin. Phys. Lett. 2020, 37, 096801

  47. [47]

    Liu, F.; Tersoff, J.; Lagally, M. G. Self-organization of steps in growth of strained films on vicinal substrates. Phys. Rev. Lett. 1998, 80, 1268-1271

  48. [48]

    Self -assembly of three -dimensional metal islands: Nonstrained versus strained islands

    Liu, F. Self -assembly of three -dimensional metal islands: Nonstrained versus strained islands. Phys. Rev. Lett. 2002, 89, 246105

  49. [49]

    Dejneka, A.; Tyunina, M.; Narkilahti, J.; Levoska, J.; Chvostova, D.; Jastrabik, L.; Trepakov, V . A. Tensile strain induced changes in the optical spectra of SrTiO 3 epitaxial thin films. Phys. Solid State 2010, 52, 2082-2089

  50. [50]

    G.; Korneta, O

    Nichols, J.; Terzic, J.; Bittle, E. G.; Korneta, O. B.; De Long, L. E.; Brill, J. W.; Cao, G.; Seo, S. S. A. Tuning electronic structure via epitaxial strain in Sr2IrO4 thin films. Appl. Phys. Lett. 2013, 102, 141908

  51. [51]

    Y .; Yang, Y

    Zhou, W.; Liu, Y . Y .; Yang, Y . Z.; Wu, P. Band Gap Engineering of SnO2 by Epitaxial Strain: 23 Experimental and Theoretical Investigations. J. Phys. Chem. C 2014, 118, 6448-6453

  52. [52]

    Heo, S.; Oh, C.; Son, J.; Jang, H. M. Influence of tensile -strain-induced oxygen deficiency on metal-insulator transitions in NdNiO3−δ epitaxial thin films. Sci. Rep. 2017, 7, 4681

  53. [53]

    Tensile-Strain-Dependent Spin States in Epitaxial LaCoO3 Thin Films

    Yokoyama, Y .; Yamasaki, Y .; Taguchi, M.; Hirata, Y .; Takubo, K.; Miyawaki, J.; Harada, Y .; Asakura, D.; Fujioka, J.; Nakamura, M.; Daimon, H.; Kawasaki, M.; Tokura, Y .; Wadati, H. Tensile-Strain-Dependent Spin States in Epitaxial LaCoO3 Thin Films. Phys. Rev. Lett. 2018, 120, 206402

  54. [54]

    Strong correlation between uniaxial magnetic anisotropic constant and in-plane tensile strain in Mn4N epitaxial films

    Hirose, T.; Komori, T.; Gushi, T.; Anzai, A.; Toko, K.; Suemasu, T. Strong correlation between uniaxial magnetic anisotropic constant and in-plane tensile strain in Mn4N epitaxial films. AIP Adv. 2020, 10, 025117

  55. [55]

    D.; Liu, J

    Cannon, D. D.; Liu, J. F.; Ishikawa, Y .; Wada, K.; Danielson, D. T.; Jongthammanurak, S.; Michel, J.; Kimerling, L. C. Tensile strained epitaxial Ge films on Si(100) substrates with potential application in L-band telecommunications. Appl. Phys. Lett. 2004, 84, 906-908

  56. [56]

    F.; Cannon, D

    Liu, J. F.; Cannon, D. D.; Wada, K.; Ishikawa, Y .; Jongthammanurak, S.; Danielson, D. T.; Michel, J.; Kimerling, L. C. Silicidation -induced band gap shrinkage in Ge epitaxial films on Si. Appl. Phys. Lett. 2004, 84, 660-662

  57. [57]

    Phase-sensitivity of Li intercalation into Sn

    Kaghazchi, P. Phase-sensitivity of Li intercalation into Sn. J. Phys.: Condens. Matter 2013, 25, 382204

  58. [58]

    Calculation of the lattice constant of solids with semilocal functionals

    Haas, P.; Tran, F.; Blaha, P. Calculation of the lattice constant of solids with semilocal functionals. Phys. Rev. B 2009, 79, 085104

  59. [59]

    A.; Fedor, J.; Iavarone, M

    Moore, S. A.; Fedor, J.; Iavarone, M. Low-temperature scanning tunneling microscopy and spectroscopy measurements of ultrathin Pb films. Supercond. Sci. Technol. 2015, 28, 045003