Paper Citation Record · LEDGER

Characterisation of analogue MAPS produced in the 65 nm TPSCo process

As of 18 August 2026, this Paper Citation Record lists 13 of 13 outbound references and 0 inbound Pith citation observations for arXiv:2411.08740.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2411.08740 v1

Coverage vector

measured 13 of 13 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-12T21:27:44.640590Z

measured 13 of 13 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-18T06:34:40.430872+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

13 of 13 outbound references displayed

verified exact2
verified fuzzy5
unresolved6
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation a7f2f806-6f2b-4223-aeb7-d4d618ff5ce8 · outbound

This paper cites Dorokhov et al.,High resistivity CMOS pixel sensors and their application to the STAR PXL detector, Nucl.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Dorokhov et al.,High resistivity CMOS pixel sensors and their application to the STAR PXL detector, Nucl

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-08-12T21:27:44.902859Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 5f4b0a7a-33a5-445a-9661-5f62a0ac2629 · outbound

This paper cites an unresolved cited work.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Unresolved cited work

Reference 2

Resolution: unresolved; raw_fallback, observed 2026-08-12T21:27:44.886434Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 633075ce-bdae-4523-bc7a-3dc7e6dafb4b · outbound

This paper cites an unresolved cited work.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Unresolved cited work

Reference 3

Resolution: unresolved; raw_fallback, observed 2026-08-12T21:27:44.869160Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation a7214893-6bf2-4cb0-b449-185421e1c8bf · outbound

This paper cites Tracking and Vertex detectors at FCC-ee.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Tracking and Vertex detectors at FCC-ee

Reference 4

Resolution: unresolved; no resolver link, observed 2026-08-12T21:27:44.592781Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation a0d7ac6c-095f-4eeb-84eb-3e12a3e0c764 · outbound

This paper cites an unresolved cited work.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Unresolved cited work

Reference 5

Resolution: unresolved; raw_fallback, observed 2026-08-12T21:27:44.850844Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation bc628251-4c2d-459d-a6e7-87e66d1b354e · outbound

This paper cites Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process

Reference 6

Resolution: verified exact; local_arxiv, observed 2026-08-12T21:27:44.728283Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 1e0325ce-6386-4dcb-a619-3ad42464ffeb · outbound

This paper cites Digital Pixel Test Structures implemented in a 65 nm CMOS process.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Digital Pixel Test Structures implemented in a 65 nm CMOS process

Reference 7

Resolution: verified exact; local_arxiv, observed 2026-08-12T21:27:44.703708Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 89600486-beac-4138-b524-afca2d16f104 · outbound

This paper cites Bugiel et al.,Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology,Nucl.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Bugiel et al.,Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology,Nucl

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-08-12T21:27:44.832035Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 156ae94e-c4c9-4d0c-9fd8-31c0b1e11a9e · outbound

This paper cites Snoeys, G.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Snoeys, G

Reference 9

Resolution: verified fuzzy; raw_fallback, observed 2026-08-12T21:27:44.814639Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 8ce2a9a3-2646-46de-9020-0103878b565e · outbound

This paper cites Banerjee, J.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Banerjee, J

Reference 10

Resolution: verified fuzzy; raw_fallback, observed 2026-08-12T21:27:44.797372Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 4c09ed9a-c9e7-4847-9200-07beb891f0bf · outbound

This paper cites an unresolved cited work.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Unresolved cited work

Reference 11

Resolution: unresolved; raw_fallback, observed 2026-08-12T21:27:44.780359Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 327bc9cf-87d6-4ac3-82d5-b21b955424a8 · outbound

This paper cites Telescope optimizer.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Telescope optimizer

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-08-12T21:27:44.763298Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.

Observation 5b92daba-2ae6-458e-87a9-60b4021feef0 · outbound

This paper cites Corryvreckan: A Modular 4D Track Reconstruction and Analysis Software for Test Beam Data.

Characterisation of analogue MAPS produced in the 65 nm TPSCo process Corryvreckan: A Modular 4D Track Reconstruction and Analysis Software for Test Beam Data

Reference 13

Resolution: unresolved; no resolver link, observed 2026-08-12T21:27:44.640590Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Pith citing papers

No inbound Pith citation observations are available.