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Ptychographic wavefront characterisation for single-particle imaging at X-ray lasers

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arxiv 2012.13783 v1 pith:44WLNLUL submitted 2020-12-26 physics.optics physics.data-an

Ptychographic wavefront characterisation for single-particle imaging at X-ray lasers

classification physics.optics physics.data-an
keywords wavefrontimagingcharacterisationexperimentalexperimentspulsessingle-particlex-ray
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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A well-characterised wavefront is important for many X-ray free-electron laser (XFEL) experiments, especially for single-particle imaging (SPI), where individual bio-molecules randomly sample a nanometer-region of highly-focused femtosecond pulses. We demonstrate high-resolution multiple-plane wavefront imaging of an ensemble of XFEL pulses, focused by Kirkpatrick-Baez (KB) mirrors, based on mixed-state ptychography, an approach letting us infer and reduce experimental sources of instability. From the recovered wavefront profiles, we show that while local photon fluence correction is crucial and possible for SPI, a small diversity of phase-tilts likely has no impact. Our detailed characterisation will aid interpretation of data from past and future SPI experiments, and provides a basis for further improvements to experimental design and reconstruction algorithms.

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