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Rapid infrared imaging for rhombohedral graphene

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arxiv 2408.09814 v1 pith:7KVFJ74H submitted 2024-08-19 cond-mat.mes-hall cond-mat.mtrl-sci

classification cond-mat.mes-hallcond-mat.mtrl-sci
keywords grapheneinfraredimagingmultilayeropticalstackedrapidbeen
verification ladder T0 review T1 audit T2 compute T3 formal
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The extrinsic stacking sequence based on intrinsic crystal symmetry in multilayer two-dimensional materials plays a significant role in determining their electronic and optical properties. Compared with Bernal-stacked (ABA) multilayer graphene, rhombohedral (ABC) multilayer graphene hosts stronger electron-electron interaction due to its unique dispersion at low-energy excitations and has been utiliazed as a unique platform to explore strongly correlated physics. However, discerning the stacking sequence has always been a quite time-consuming process by scanning mapping methods. Here, we report a rapid recognition method for ABC- stacked graphene with high accuracy by infrared imaging based on the distinct optical responses at infrared range. The optical contrast of the image between ABC and ABA stacked graphene is strikingly clear, and the discernibility is comparable to traditional optical Raman microscopy but with higher consistency and throughput. We further demonstrate that the infrared imaging technique can be integrated with dry transfer techniques commonly used in the community. This rapid and convenient infrared imaging technique will significantly improve the sorting efficiency for differently stacked multilayer graphene, thereby accelerating the exploration of the novel emergent correlated phenomena in ABC stacked graphene.

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