Pith. sign in

REVIEW 1 cited by

Label Propagation with Weak Supervision

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2210.03594 v3 pith:7YILNBSP submitted 2022-10-07 cs.LG stat.ML

classification cs.LGstat.ML
keywords informationlearningsupervisedweakweaklydatalabelmultiple
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
read the original abstract

Semi-supervised learning and weakly supervised learning are important paradigms that aim to reduce the growing demand for labeled data in current machine learning applications. In this paper, we introduce a novel analysis of the classical label propagation algorithm (LPA) (Zhu & Ghahramani, 2002) that moreover takes advantage of useful prior information, specifically probabilistic hypothesized labels on the unlabeled data. We provide an error bound that exploits both the local geometric properties of the underlying graph and the quality of the prior information. We also propose a framework to incorporate multiple sources of noisy information. In particular, we consider the setting of weak supervision, where our sources of information are weak labelers. We demonstrate the ability of our approach on multiple benchmark weakly supervised classification tasks, showing improvements upon existing semi-supervised and weakly supervised methods.

Discussion (0). Sign in to comment.

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Exploiting Vision Language Model for Training-Free 3D Point Cloud OOD Detection via Graph Score Propagation

    cs.CV 2025-06 conditional novelty 6.0 of 10

    Graph Score Propagation propagates ID prototype scores across a KNN graph of VLM text and 3D point cloud features, with prompt clustering and self-trained negative prompts, improving zero-shot and few-shot 3D OOD detection.

Pith tools