Paper Citation Record · LEDGER

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning

As of 7 August 2026, this Paper Citation Record lists 21 of 21 outbound references and 0 inbound Pith citation observations for arXiv:2506.03556.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2506.03556 v1

Coverage vector

measured 21 of 21 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-07T11:06:54.984013Z

measured 21 of 21 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-07T06:34:17.273281+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

21 of 21 outbound references displayed

verified exact0
verified fuzzy19
unresolved2
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 7b3eae5d-6cee-4789-972f-1202d9540a41 · outbound

This paper cites Farthest-point sampling for wafer-level variation modeling,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Farthest-point sampling for wafer-level variation modeling,

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:57.571579Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation d199a42e-5c22-4c5b-b30d-7570e85717b1 · outbound

This paper cites an unresolved cited work.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Unresolved cited work

Reference 2

Resolution: unresolved; no resolver link, observed 2026-08-07T11:06:54.915427Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 415ed707-2790-4528-af06-9b9b82015814 · outbound

This paper cites Machine learning applications in semiconductor manufacturing: A review,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Machine learning applications in semiconductor manufacturing: A review,

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:57.392856Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 17f524f1-93c9-4db0-9520-fdad849f61b9 · outbound

This paper cites Optimizing test yield in semiconductor production through hybrid sampling techniques,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Optimizing test yield in semiconductor production through hybrid sampling techniques,

Reference 4

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:57.216388Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation b0fc1ded-d67a-4723-ba31-882106a8c1f8 · outbound

This paper cites Advanced test strategies for semi- conductor wafer inspection using machine learning,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Advanced test strategies for semi- conductor wafer inspection using machine learning,

Reference 5

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:57.056629Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 18926c6b-5bcb-4770-bd90-102b7ec3b8a6 · outbound

This paper cites Uncertainty-driven sampling for efficient wafer testing,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Uncertainty-driven sampling for efficient wafer testing,

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:56.899075Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 2b39255c-4e4f-473b-9354-4accff5c6d70 · outbound

This paper cites Efficient wafer-level spatial variation modeling for multi-site rf IC testing,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Efficient wafer-level spatial variation modeling for multi-site rf IC testing,

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:56.752847Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 905246dd-7292-4e95-bb54-47ccd6e9d123 · outbound

This paper cites Wafer-level variation modeling for multi-site RF IC testing via hier- archical gaussian process,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Wafer-level variation modeling for multi-site RF IC testing via hier- archical gaussian process,

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:56.647939Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 984fee52-3426-468c-95e7-23446d691890 · outbound

This paper cites an unresolved cited work.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Unresolved cited work

Reference 9

Resolution: unresolved; no resolver link, observed 2026-08-07T11:06:54.944043Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 4d99a61d-ab22-47e0-aefb-e6c2fcfafed6 · outbound

This paper cites A survey of spatial sampling techniques for industrial applications,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning A survey of spatial sampling techniques for industrial applications,

Reference 10

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:56.467510Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 98ea751b-db25-40e7-9d1d-23865d18cbdc · outbound

This paper cites Comparison of sampling techniques for RF test data in semiconductor manufacturing,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Comparison of sampling techniques for RF test data in semiconductor manufacturing,

Reference 11

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:56.244776Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation a44bcaf5-97dc-49f6-b15e-497e1bf8d2e3 · outbound

This paper cites Custom adaptive kernel strategies for gaussian process regression in wafer-level modeling and FPGA delay analysis,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Custom adaptive kernel strategies for gaussian process regression in wafer-level modeling and FPGA delay analysis,

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:56.020887Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 2204ca2a-dd90-4cf9-8781-df30526018b8 · outbound

This paper cites Efficient large-scale GPR via inducing-point sampling in spatial domains,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Efficient large-scale GPR via inducing-point sampling in spatial domains,

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.831617Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 45b8291c-6ac8-45bf-a602-6a2111b380de · outbound

This paper cites A stratified sampling strategy for semiconductor quality prediction,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning A stratified sampling strategy for semiconductor quality prediction,

Reference 14

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.567885Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 5a9fe78d-236a-43ce-82bf-4afcd4ac5b4e · outbound

This paper cites Spatial stratified sampling for environmental mon- itoring applied to wafer testing,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Spatial stratified sampling for environmental mon- itoring applied to wafer testing,

Reference 15

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.383768Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 5204abdd-da5d-4549-89e6-d4d5d59e2c1c · outbound

This paper cites Data clustering: 50 years beyond K-means,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Data clustering: 50 years beyond K-means,

Reference 16

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.222733Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 3b1ad505-d6e5-4b32-b6dc-18b4c1137b34 · outbound

This paper cites Adaptive sampling strategies for FPGA testing using deep gaussian processes,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Adaptive sampling strategies for FPGA testing using deep gaussian processes,

Reference 17

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.197772Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 425870f7-74fb-41cf-838b-5c6860d6c3e7 · outbound

This paper cites Hybrid spatial-value sampling for process monitor- ing in IC fabrication,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Hybrid spatial-value sampling for process monitor- ing in IC fabrication,

Reference 18

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.173650Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation dde725a4-78fb-4fca-a026-719b8a2a19b1 · outbound

This paper cites Distance-based clustering for sensor placement in wafer inspection,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Distance-based clustering for sensor placement in wafer inspection,

Reference 19

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.146028Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation a14e913f-4590-4b69-987a-98fe4c733b4d · outbound

This paper cites Graph-based sampling in gaussian process models for semiconductor reliability prediction,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Graph-based sampling in gaussian process models for semiconductor reliability prediction,

Reference 20

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.030107Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 19e7850f-0ed8-4595-8125-67c6c301f279 · outbound

This paper cites Active learning for spatial sampling in semicon- ductor testing,.

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning Active learning for spatial sampling in semicon- ductor testing,

Reference 21

Resolution: verified fuzzy; raw_fallback, observed 2026-08-07T11:06:55.016013Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Pith citing papers

No inbound Pith citation observations are available.