Experimentally Realizable C-NOT Gate in a Flux Qubit/Resonator System

In this paper we present an experimentally realizable microwave pulse sequence that effects a Controlled NOT (C-NOT) gate operation on a Josephson junction-based flux-qubit/resonator system with high fidelity in the end state. We obtained a C-NOT gate process fidelity of 0.988 (0.980) for a two (three) qubit/resonator system under ideal conditions, and a fidelity of 0.903 for a two qubit/resonator system under the best, currently achieved, experimental conditions. In both cases, we found that "qubit leakage" to higher levels of the resonator causes a majority of the loss of fidelity, and that such leakage becomes more pronounced as decoherence effects increase.