Investigation of Deformation and Fracture Mechanisms in Two-dimensional Gallium Telluride Multilayers Using Nanoindentation

Two-dimensional (2D) materials possess great potential for flexible devices, ascribing to their outstanding electrical, optical, and mechanical properties. However, their mechanical deformation property and fracture mechanism, which are inescapable in many applications like flexible optoelectronics, are still unclear or not thoroughly investigated due methodology limitations. In light of this, such mechanical properties and mechanisms are explored on example of gallium telluride (GaTe), a promising optoelectronic candidate with an ultrahigh photo-responsibility and a high plasticity within 2D family. Considering the driving force insufficient in atomic force microscopy (AFM)-based nanoindentation method, here the mechanical properties of both substrate-supported and suspended GaTe multilayers were systematically investigated through full-scale Berkovich-tip nanoindentation, micro-Raman spectroscopy, AFM, and scanning electron microscopy. An unusual concurrence of multiple pop-in and load-drop events in loading curve was observed. By further correlating to molecular dynamics calculations, this concurrence was unveiled originating from the interlayer sliding mediated layers-by-layers fracture mechanism within GaTe multilayers. The van der Waals force between GaTe multilayers and substrates was revealed much stronger than that between GaTe interlayers, resulting in the easy sliding and fracture of multilayers within GaTe. This work provides new insights into the deformation and fracture mechanisms of GaTe and other similar 2D multilayers in flexible applications.