The reviewed record of science sign in
Pith

arxiv: 1909.05372 · v1 · pith:JYMCMX3H · submitted 2019-09-07 · cs.LG · cs.CL· cs.DB

Overton: A Data System for Monitoring and Improving Machine-Learned Products

Reviewed by Pith T0 review T1 audit T2 compute T3 formal T4 kernel pith:JYMCMX3Hrecord.jsonopen to challenge →

classification cs.LG cs.CLcs.DB
keywords overtonapplicationsmonitoringengineersproductiondataerrorsimproving
0
0 comments X
read the original abstract

We describe a system called Overton, whose main design goal is to support engineers in building, monitoring, and improving production machine learning systems. Key challenges engineers face are monitoring fine-grained quality, diagnosing errors in sophisticated applications, and handling contradictory or incomplete supervision data. Overton automates the life cycle of model construction, deployment, and monitoring by providing a set of novel high-level, declarative abstractions. Overton's vision is to shift developers to these higher-level tasks instead of lower-level machine learning tasks. In fact, using Overton, engineers can build deep-learning-based applications without writing any code in frameworks like TensorFlow. For over a year, Overton has been used in production to support multiple applications in both near-real-time applications and back-of-house processing. In that time, Overton-based applications have answered billions of queries in multiple languages and processed trillions of records reducing errors 1.7-2.9 times versus production systems.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.