REVIEW 1 cited by
Injecting Software Vulnerabilities with Voltage Glitching
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
classification
cs.CR
keywords
glitchingvoltageattackbehaviorbootcausecmoscode
Signed reviews
read the original abstract
We show how voltage glitching can cause timing violations in CMOS behavior. Then we attack a real, security hardened, consumer device to gain code execution and dump the secure boot ROM.
Forward citations
Cited by 1 Pith paper
-
Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation
A fully synthesizable, DLL-based clock-pulse-width monitor with an automation framework detects clock glitches and voltage, EM, and temperature timing faults in 65nm silicon.
Discussion (0). Continue with ORCID to comment.