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Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature

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arxiv 1901.11400 v1 pith:NQ65DB2I submitted 2019-01-29 astro-ph.IM gr-qc

Joshua R. Smith , Rana X Adhikari , Katerin M. Aleman , Adrian Avila-Alvarez , Garilynn Billingsley , Amy Gleckl , Jazlyn Guerrero , Ashot Markosyan
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Steven Penn Juan A. Rocha Dakota Rose Robert Wright
This is my paper · ORCID
classification astro-ph.IMgr-qc
keywords annealingcoatingsopticalscatteramorphousapparatusassesscrystal
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Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.

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