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Paper Citation Record · LEDGER

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data

As of 21 August 2026, this Paper Citation Record lists 33 of 33 outbound references and 0 inbound Pith citation observations for arXiv:1908.00659.

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pith.paper-citation-record.v1
1908.00659 v2

Coverage vector

measured 33 of 33 reference resolution

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Pith citing papers itemized under the disclosed page cap.

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Reference resolution

33 of 33 outbound references displayed

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External citation measurements

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Outbound references

Observation 1cee1376-121f-4538-a12f-684e62b14e05 · outbound

This paper cites Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution,

Reference 1

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Observation a9c74936-c6bf-470b-8cf2-35bc5837b7ca · outbound

This paper cites Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry,

Reference 2

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Observation 33f8fb67-1e17-4f01-84e7-92e2eac081d2 · outbound

This paper cites High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy,

Reference 3

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Observation 9ce1880b-113d-462b-b9cf-eb0d1b18624a · outbound

This paper cites PHASE CONTRAST IN SCANNING TRANSMISSION ELECTRON MICROSCOPY.,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data PHASE CONTRAST IN SCANNING TRANSMISSION ELECTRON MICROSCOPY.,

Reference 4

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Observation 69b8073c-18fc-4690-8da7-8fff22b9d5c5 · outbound

This paper cites DIFFERENTIAL PHASE CONTRAST IN A STEM.,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data DIFFERENTIAL PHASE CONTRAST IN A STEM.,

Reference 5

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Observation c12ad81f-35ba-4d8f-ae2a-b26200e9f8a6 · outbound

This paper cites Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy,

Reference 6

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Observation f196a478-2b43-44ef-97ed-84ec21ef8cc2 · outbound

This paper cites Dynamics of annular bright field imaging in scanning transmission electron microscopy.,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Dynamics of annular bright field imaging in scanning transmission electron microscopy.,

Reference 7

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Observation 60965333-eac2-46bd-83ad-a521c006f798 · outbound

This paper cites Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy,

Reference 8

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Observation de286585-f482-4dae-a77e-33a28a66de38 · outbound

This paper cites Differential phase contrast microscopy of magnetic materials,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Differential phase contrast microscopy of magnetic materials,

Reference 9

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Observation cf184161-9e8e-47c0-b338-fd48b8766899 · outbound

This paper cites Differential phase- contrast microscopy at atomic resolution,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Differential phase- contrast microscopy at atomic resolution,

Reference 10

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Observation 4e7f75bc-0223-4949-8f41-53511b2adc3b · outbound

This paper cites Differential phase contrast 2.0—Opening new ‘fields’ for an established technique,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Differential phase contrast 2.0—Opening new ‘fields’ for an established technique,

Reference 11

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Observation 111762ac-d71c-4d98-8ae2-050da6bd445d · outbound

This paper cites Nonstandard imaging methods in electron microscopy.,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Nonstandard imaging methods in electron microscopy.,

Reference 12

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Observation f1877d2a-b2e6-454e-b843-1959bbb984cf · outbound

This paper cites Enhanced light element imaging in atomic resolution scanning transmission electron microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Enhanced light element imaging in atomic resolution scanning transmission electron microscopy,

Reference 13

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Observation 73f1f940-0ffd-429e-81b9-d7bbc064fbaf · outbound

This paper cites Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy,

Reference 14

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Observation b667db40-4e57-46f4-8e6f-ee62ab703e45 · outbound

This paper cites Experimental tests on double-resolution coherent imaging via STEM,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Experimental tests on double-resolution coherent imaging via STEM,

Reference 15

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Observation 972c3400-931b-4f17-a4de-b7ba8e42efc7 · outbound

This paper cites Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions,

Reference 16

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Observation fb9b45ec-5283-4969-9b14-402767a57943 · outbound

This paper cites Structure retrieval with fast electrons using segmented detectors,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Structure retrieval with fast electrons using segmented detectors,

Reference 17

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Observation 2d58e6d8-4537-4c87-afa2-2ebb5e1c266e · outbound

This paper cites Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction,

Reference 18

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Observation 1b612552-16f8-4381-b543-e306cecd49ba · outbound

This paper cites Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy,

Reference 19

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Observation 0eed5f41-060f-4707-a06a-46aac8ee0245 · outbound

This paper cites Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons,

Reference 20

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Observation 3ea3234f-a9f3-48c2-8cd9-33b57e11c5bc · outbound

This paper cites Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrast,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrast,

Reference 21

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Observation edb32aa6-f82c-4d3a-930e-008943daf94c · outbound

This paper cites Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy,

Reference 22

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Observation ebd27de4-b35e-4377-b4a5-195eb1ee8ac4 · outbound

This paper cites Mitigating e-beam-induced hydrocarbon deposition on graphene for atomic-scale scanning transmission electron microscopy studies,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Mitigating e-beam-induced hydrocarbon deposition on graphene for atomic-scale scanning transmission electron microscopy studies,

Reference 23

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Observation e2f7a1fa-2f04-4031-85da-4d25de214215 · outbound

This paper cites Placing single atoms in graphene with a scanning transmission electron microscope,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Placing single atoms in graphene with a scanning transmission electron microscope,

Reference 24

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Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Regularization and variable selection via the elastic net,

Reference 25

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Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Regression shrinkage and selection via the lasso,

Reference 26

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Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Pathwise coordinate optimization,

Reference 27

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This paper cites Regularization paths for generalized linear models via coordinate descent,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Regularization paths for generalized linear models via coordinate descent,

Reference 28

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Observation ba00e4d8-ad76-40d8-bd9a-d5ba2cd8384d · outbound

This paper cites Direct Determination of the Chemical Bonding of Individual Impurities in Graphene,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Direct Determination of the Chemical Bonding of Individual Impurities in Graphene,

Reference 29

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Observation 7b0219ac-6480-4132-a709-2da9bb7b2d8e · outbound

This paper cites Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy,

Reference 30

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Observation 27700580-7ff4-4188-acd7-a7f6b1abf9ca · outbound

This paper cites Sparse regression with exact clustering,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Sparse regression with exact clustering,

Reference 31

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Observation 4d680b5d-e100-4840-a156-257f80e6d96f · outbound

This paper cites Structured Variable Selection with Sparsity-Inducing Norms,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Structured Variable Selection with Sparsity-Inducing Norms,

Reference 32

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This paper cites Manifold learning of four-dimensional scanning transmission electron microscopy,.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Manifold learning of four-dimensional scanning transmission electron microscopy,

Reference 33

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