Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-14T15:43:39.252719Z
Paper Citation Record · LEDGER
As of 21 August 2026, this Paper Citation Record lists 33 of 33 outbound references and 0 inbound Pith citation observations for arXiv:1908.00659.
A citation records a reference. It does not transfer a finding from one paper to another.
Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-14T15:43:39.252719Z
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-21T06:32:19.484+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
33 of 33 outbound references displayed
External citation measurements
No source-named external measurement is stored.
Observation 1cee1376-121f-4538-a12f-684e62b14e05 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution,
Reference 1
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation a9c74936-c6bf-470b-8cf2-35bc5837b7ca · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry,
Reference 2
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 33f8fb67-1e17-4f01-84e7-92e2eac081d2 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy,
Reference 3
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 9ce1880b-113d-462b-b9cf-eb0d1b18624a · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data PHASE CONTRAST IN SCANNING TRANSMISSION ELECTRON MICROSCOPY.,
Reference 4
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 69b8073c-18fc-4690-8da7-8fff22b9d5c5 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data DIFFERENTIAL PHASE CONTRAST IN A STEM.,
Reference 5
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation c12ad81f-35ba-4d8f-ae2a-b26200e9f8a6 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy,
Reference 6
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation f196a478-2b43-44ef-97ed-84ec21ef8cc2 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Dynamics of annular bright field imaging in scanning transmission electron microscopy.,
Reference 7
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 60965333-eac2-46bd-83ad-a521c006f798 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy,
Reference 8
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation de286585-f482-4dae-a77e-33a28a66de38 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Differential phase contrast microscopy of magnetic materials,
Reference 9
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation cf184161-9e8e-47c0-b338-fd48b8766899 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Differential phase- contrast microscopy at atomic resolution,
Reference 10
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 4e7f75bc-0223-4949-8f41-53511b2adc3b · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Differential phase contrast 2.0—Opening new ‘fields’ for an established technique,
Reference 11
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 111762ac-d71c-4d98-8ae2-050da6bd445d · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Nonstandard imaging methods in electron microscopy.,
Reference 12
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation f1877d2a-b2e6-454e-b843-1959bbb984cf · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Enhanced light element imaging in atomic resolution scanning transmission electron microscopy,
Reference 13
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 73f1f940-0ffd-429e-81b9-d7bbc064fbaf · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy,
Reference 14
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation b667db40-4e57-46f4-8e6f-ee62ab703e45 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Experimental tests on double-resolution coherent imaging via STEM,
Reference 15
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 972c3400-931b-4f17-a4de-b7ba8e42efc7 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions,
Reference 16
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation fb9b45ec-5283-4969-9b14-402767a57943 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Structure retrieval with fast electrons using segmented detectors,
Reference 17
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 2d58e6d8-4537-4c87-afa2-2ebb5e1c266e · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction,
Reference 18
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 1b612552-16f8-4381-b543-e306cecd49ba · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy,
Reference 19
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 0eed5f41-060f-4707-a06a-46aac8ee0245 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons,
Reference 20
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 3ea3234f-a9f3-48c2-8cd9-33b57e11c5bc · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrast,
Reference 21
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation edb32aa6-f82c-4d3a-930e-008943daf94c · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy,
Reference 22
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation ebd27de4-b35e-4377-b4a5-195eb1ee8ac4 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Mitigating e-beam-induced hydrocarbon deposition on graphene for atomic-scale scanning transmission electron microscopy studies,
Reference 23
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation e2f7a1fa-2f04-4031-85da-4d25de214215 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Placing single atoms in graphene with a scanning transmission electron microscope,
Reference 24
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation c8eb02d3-543e-4638-b716-d7f1f67c1a83 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Regularization and variable selection via the elastic net,
Reference 25
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation d818d731-4e7e-4ba3-9ebc-9e744f8f55c2 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Regression shrinkage and selection via the lasso,
Reference 26
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation ee551729-9d0e-423b-bb8b-56c50f2ca06e · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Pathwise coordinate optimization,
Reference 27
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 930a1ca2-28a6-4e18-bd5b-65f61cc98f55 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Regularization paths for generalized linear models via coordinate descent,
Reference 28
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation ba00e4d8-ad76-40d8-bd9a-d5ba2cd8384d · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Direct Determination of the Chemical Bonding of Individual Impurities in Graphene,
Reference 29
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 7b0219ac-6480-4132-a709-2da9bb7b2d8e · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy,
Reference 30
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 27700580-7ff4-4188-acd7-a7f6b1abf9ca · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Sparse regression with exact clustering,
Reference 31
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 4d680b5d-e100-4840-a156-257f80e6d96f · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Structured Variable Selection with Sparsity-Inducing Norms,
Reference 32
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 1628fcc6-f022-4d52-9931-05ababc28892 · outbound
Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data Manifold learning of four-dimensional scanning transmission electron microscopy,
Reference 33
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
No inbound Pith citation observations are available.