EDEPR of impurity centers embedded in silicon microcavities
classification
❄️ cond-mat.mes-hall
cond-mat.supr-con
keywords
centersedeprcavityconfineddeepdelta-barriersdifferentelectrically-detected
read the original abstract
We present the first findings of the new electrically-detected EPR (EDEPR) technique which reveal different shallow and deep centers without using the external cavity as well as the hf source and recorder, with measuring the only magnetoresistance of the Si-QW confined by the superconductor delta-barriers.
This paper has not been read by Pith yet.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.