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Quantitative analysis of the critical current due to vortex pinning by surface corrugation

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arxiv cond-mat/0404332 v1 pith:RDKM3WP4 submitted 2004-04-14 cond-mat.supr-con

Quantitative analysis of the critical current due to vortex pinning by surface corrugation

Alain Pautrat , J. Scola , C. Goupil , Ch. Simon , C. Villard , B. Domenges , Y. Simon , Ch. Guilpin
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L. Mechin
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classification cond-mat.supr-con
keywords surfacecriticalcurrentanalysispinningroughnessanglebeam
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The transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by the spectral analysis of the surface roughness. Increasing the surface roughness using a Focused Ion Beam results also in an increase of the superficial critical current.

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