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Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

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arxiv 1403.1225 v1 pith:RKQ2F3MB submitted 2014-03-05 cond-mat.mtrl-sci cond-mat.mes-hall

Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

Eugene A. Eliseev , Anna N. Morozovska , Anton V. Ievlev , Nina Balke , Peter Maksymovych , Alexander Tselev , Sergei V. Kalinin This is my paper
classification cond-mat.mtrl-sci cond-mat.mes-hall
keywords microscopycapacitivecontributionselectrostrictiveincludingproberesponsesscanning
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

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