Delta-T noise in the Kondo regime

We study the delta-T noise in the Kondo regime, which implies the charge current noise under the temperature bias for the SU(2) Kondo quantum dot. We propose an experimentally measurable quantity to quantify the low-temperature properties in the delta-T noise: $S_{\ell}=S(T_{\mathrm{L}},T_{\mathrm{R}}) - (1/2)[S(T_{\mathrm{L}},T_{\mathrm{L}}) + S(T_{\mathrm{R}},T_{\mathrm{R}})]$, which yields the shot noise expression in the noninteracting limit. We calculate this quantity for the SU(2) Kondo quantum dot in the particle-hole symmetric case. We found that the $S_{\ell}$ exhibits qualitatively the same behavior in both the electrochemical potential biased case and the temperature biased case. The quantitative difference appears as a difference of the coefficients of the noises, which reflects the difference of the Fermi distribution function: electrochemical potential biased or temperature biased.