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Characterization methods dedicated to nanometer-thick hBN layers

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arxiv 1610.06858 v1 pith:TKLBJIZD submitted 2016-10-21 cond-mat.mtrl-sci

Leonard Schue , Ingrid Stenger , Frederic Fossard , Annick Loiseau , Julien Barjon This is my paper · ORCID
classification cond-mat.mtrl-sci
keywords characterizationopticalstructurallayerspropertiesspectroscopiesadditionalanalysis
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Hexagonal boron nitride (hBN) regains interest as a strategic component in graphene engineering and in van der Waals heterostructures built with two dimensional materials. It is crucial then, to handle reliable characterization techniques capable to assess the quality of structural and electronic properties of the hBN material used. We present here characterization procedures based on optical spectroscopies, namely cathodoluminescence and Raman, with the additional support of structural analysis conducted by transmission electron microscopy. We show the capability of optical spectroscopies to investigate and benchmark the optical and structural properties of various hBN thin layers sources.

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  1. Quantifying the creation of negatively charged boron vacancies in He-ion irradiated hexagonal boron nitride

    cond-mat.mes-hall 2025-01 conditional novelty 5.0 of 10

    Using a microscopic charge model plus a fitted background charge, the authors estimate that about 0.2% of all helium-created boron vacancies in hBN become optically active VB- defects, with the true fraction possibly higher.

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