Paper Citation Record · LEDGER

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films

As of 16 August 2026, this Paper Citation Record lists 24 of 24 outbound references and 0 inbound Pith citation observations for arXiv:2607.07273.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.07273 v1

Coverage vector

measured 24 of 24 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-07-09T15:40:44.176178Z

measured 24 of 24 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-15T06:32:42.880941+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

24 of 24 outbound references displayed

verified exact22
verified fuzzy1
unresolved0
parse uncertain0
malformed identifier1
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 8e7cf97e-82d4-4582-8732-90148423a5f5 · outbound

This paper cites Zhang, S.-W.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Zhang, S.-W

Reference 1

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.166108Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 732981a0-1367-4c6e-8cd7-0aada4b45219 · outbound

This paper cites Calahorra, B.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Calahorra, B

Reference 2

Resolution: verified exact; arxiv_id, observed 2026-07-09T15:46:19.137341Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 0e21c216-5447-48c8-b297-aea0859abfc5 · outbound

This paper cites Zhang, S.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Zhang, S

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-07-09T15:46:19.245846Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 78e375bb-a8f1-4d48-a2cb-95a5fe6f1217 · outbound

This paper cites an unresolved cited work.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Unresolved cited work

Reference 5

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.164500Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 4d659032-848d-417d-be19-e7de66789c8e · outbound

This paper cites Huang, L.-X.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Huang, L.-X

Reference 6

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.141422Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 2f23ca12-b5c4-4d92-8778-3edc8345c2d3 · outbound

This paper cites an unresolved cited work.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Unresolved cited work

Reference 7

Resolution: malformed identifier; doi_truncated, observed 2026-07-09T15:46:19.150872Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 0bc08177-2994-45c7-ae89-a451344b2d73 · outbound

This paper cites an unresolved cited work.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Unresolved cited work

Reference 8

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.143433Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation ce1f3649-8b9b-4bee-ae28-8e5bd7deeaec · outbound

This paper cites Ramizy, Z.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Ramizy, Z

Reference 9

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.171158Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 5aa681e1-5ad6-40b6-90bd-0c855c84bdc0 · outbound

This paper cites Benton, J.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Benton, J

Reference 10

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.141773Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 7792e2c2-a750-4983-aaad-781f9395298a · outbound

This paper cites an unresolved cited work.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Unresolved cited work

Reference 11

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.148938Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 71985c8e-2324-4824-b7f6-7b30f0427fe6 · outbound

This paper cites Keller, S.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Keller, S

Reference 12

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.160411Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation fe08b40f-39b2-4a1f-a5e1-724e6dce59ce · outbound

This paper cites Zhang, S.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Zhang, S

Reference 13

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.147128Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation bd8f77c6-6d65-401d-9e0d-fa324c8fc8ed · outbound

This paper cites Zhang, B.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Zhang, B

Reference 14

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.139687Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 3c36711e-2307-402b-974b-c624690f426c · outbound

This paper cites an unresolved cited work.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Unresolved cited work

Reference 15

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.169589Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation c6d74676-e0ac-436f-9071-dc7bff7c8320 · outbound

This paper cites an unresolved cited work.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Unresolved cited work

Reference 16

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.153136Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation fb7262d0-091a-4072-b09d-80cafbea7c0b · outbound

This paper cites Salzer, S.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Salzer, S

Reference 17

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.145140Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 5f1085ef-e1a8-4373-ae5c-ddef32917353 · outbound

This paper cites Jørgensen, K.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Jørgensen, K

Reference 18

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.158400Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 05aa32c4-4731-4ea6-a3df-c0041bdd1ea8 · outbound

This paper cites Sciazko, Y.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Sciazko, Y

Reference 19

Resolution: verified exact; arxiv_id, observed 2026-07-09T15:46:19.155833Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 52a9c9c0-36b5-4b67-a86b-ef804d92cb36 · outbound

This paper cites Nečas, P.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Nečas, P

Reference 20

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.157842Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation c44d718a-4b03-4078-a73b-d2a953042199 · outbound

This paper cites Thornley, M.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Thornley, M

Reference 21

Resolution: verified exact; arxiv_id, observed 2026-07-09T15:46:19.162832Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 10b06aca-4a05-4d44-b822-31a34625adc1 · outbound

This paper cites Medjahed, C.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Medjahed, C

Reference 22

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.162290Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 6dd38b1e-c2b7-4036-9561-2ac6cb75ceff · outbound

This paper cites Chen, J.-S.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Chen, J.-S

Reference 23

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.172807Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 4f4e8bf4-0cf8-4db4-a3aa-b30d063fa557 · outbound

This paper cites Kuntyi, G.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Kuntyi, G

Reference 24

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.167696Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Observation 3038f594-74bd-4c9f-8e30-6dcb0d0b06a5 · outbound

This paper cites an unresolved cited work.

Improving feature resolution and pore back effect in focused ion beam tomography of porous GaN thin films Unresolved cited work

Reference 25

Resolution: verified exact; doi, observed 2026-07-09T15:46:19.159898Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.

Pith citing papers

No inbound Pith citation observations are available.