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Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

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arxiv 1011.1155 v1 pith:VLQNLPFY submitted 2010-11-04 cond-mat.mes-hall

Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

classification cond-mat.mes-hall
keywords couplingmicropillarquantumregimecoherentfactorkappamuev
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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We report on the coherent reflection spectroscopy of a high-quality factor micropillar, in the strong coupling regime with a single InGaAs annealed quantum dot. The absolute reflectivity measurement is used to study the characteristics of our device at low and high excitation power. The strong coupling is obtained with a g=16 \mueV coupling strength in a 7.3\mum diameter micropillar, with a cavity spectral width kappa=20.5 \mueV (Q=65 000). The factor of merit of the strong-coupling regime, 4g/kappa=3, is the current state-of-the-art for a quantum dot-micropillar system.

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