Interaction of the Electromagnetic S-Wave with the Thin Metal Film
classification
🧮 math-ph
math.MPphysics.opticsquant-ph
keywords
electromagneticthicknessmetalreflectionthinabsorptionallowsanalysis
read the original abstract
It is shown that for thin metal films, thickness of which does not exceed a thickness of a skin-layer, the problem allows analytical solution for any boundary conditions. The analysis of transmission, reflection and absorption of an electromagnetic wave coefficients depending on a angle of incidence, thickness of a layer, coefficient of specular reflection and frequency of oscillations of electromagnetic field is carried out.
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