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Ferroelectric properties of SrRuO3/BaTiO3/SrRuO3 ultrathin film capacitors free from passive lay

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arxiv cond-mat/0506495 v1 pith:7Q6BIRLU submitted 2005-06-20 cond-mat.mtrl-sci

Ferroelectric properties of SrRuO3/BaTiO3/SrRuO3 ultrathin film capacitors free from passive lay

Y. S. Kim , J. Y. Jo , D. J. Kim , Y. J. Chang , J. H. Lee , T. W. Noh , T. K. Song , J.-G. Yoon
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J.-S. Chung S. I. Baik Y.-W. Kim C. U. Chung
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classification cond-mat.mtrl-sci
keywords batio3srruo3capacitorsferroelectricinterfacespassiveultrathincannot
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Structural studies on ultrathin SrRuO3/BaTiO3/SrRuO3 capacitors, with BaTiO3 thicknesses of between 5 nm and 30 nm, show well-defined interfaces between ferroelectric BaTiO3 and electrode SrRuO3 layers. In these capacitors, we cannot observe any extrinsic electrical effects due to either the formation of an insulating interfacial passive layer or passive-layer-induced charge injection. Such high quality interfaces result in very good fatigue endurance, even for the 5 nm thick BaTiO3 capacitor.

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