Pith Number

pith:JNYAWNO4

pith:2026:JNYAWNO4SRWWLX3DMPP6DBNK6U

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A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM

Julien Guyon (LEM3), Luc Morhain (LEM3), Nabila Maloufi (LEM3), Nathalie Gey (LEM3), Nohayla El-Khairaoui (LEM3)

A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM

arxiv:2605.18386 v1 · 2026-05-18 · physics.ins-det · cond-mat.mtrl-sci

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Claims

C1strongest claim

it is demonstrated that with a single DED assisted by an orientable support, it is possible to perform multiple advanced microstructural characterizations of both bulk samples and thin foils in the same SEM.

C2weakest assumption

The assumption that precise translation and rotation movements combined with energy filtering and custom post-processing will consistently produce high-quality, easily indexable Kikuchi patterns and usable micrographs across all listed geometries without significant artifacts or loss of resolution.

C3one line summary

A single orientable Timepix3 detector enables EBSD, RKD, TKD in multiple geometries plus BSE/ECCI/STEM-in-SEM imaging in one SEM for bulk and thin-foil samples.

References

22 extracted · 22 resolved · 0 Pith anchors

[1] A.J. Schwartz, M. Kumar, B.L. Adams, D.P. Field, eds., Electron Backscatter Diffraction in Ma- terials Science, Springer US, Boston, MA, 2009. https://doi.org/10.1007/978-0-387-88136-2 2009 · doi:10.1007/978-0-387-88136-2

[2] Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using elec- tron channeling contrast, Microscopy Res & Techniqu e 69 (2006) 374 –381 2006 · doi:10.1002/jemt.20293

[3] H. Mansour, M.A. Crimp, N. Gey, X. Iltis, N. Maloufi, Dislocation analysis of a complex sub - grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scan- ning electr 2019 · doi:10.1016/j.ceramint.2019.06.091

[4] R.R. Keller, R.H. Geiss, Transmission EBSD from 10 nm domains in a scanning electron micro- scope, Journal of Microscopy 245 (2012) 245 –251. http s://doi.org/10.1111/j.1365- 2818.2011.03566.x 2012 · doi:10.1111/j.1365-

[5] https://analyticalscience.wiley.com/content/ar- ticle-do/stem-in-sem-re-emerging-material-measurement-approach (accessed March 19, 2026) 2022

Formal links

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Receipt and verification

First computed	2026-05-20T00:05:58.273327Z
Builder	pith-number-builder-2026-05-17-v1
Signature	Pith Ed25519 (`pith-v1-2026-05`) · public key
Schema	pith-number/v1.0

Canonical hash

4b700b35dc946d65df6363dfe185aaf51a149e1fa622815064c796439f6cb338

Aliases

arxiv: 2605.18386 · arxiv_version: 2605.18386v1 · doi: 10.48550/arxiv.2605.18386 · pith_short_12: JNYAWNO4SRWW · pith_short_16: JNYAWNO4SRWWLX3D · pith_short_8: JNYAWNO4

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Verify this Pith Number yourself

curl -sH 'Accept: application/ld+json' https://pith.science/pith/JNYAWNO4SRWWLX3DMPP6DBNK6U \
  | jq -c '.canonical_record' \
  | python3 -c "import sys,json,hashlib; b=json.dumps(json.loads(sys.stdin.read()), sort_keys=True, separators=(',',':'), ensure_ascii=False).encode(); print(hashlib.sha256(b).hexdigest())"
# expect: 4b700b35dc946d65df6363dfe185aaf51a149e1fa622815064c796439f6cb338

Canonical record JSON

{
  "metadata": {
    "abstract_canon_sha256": "fc28913a1a1a2b6ff1c850755b6318058b7c8a43e5b47935740e79fbb0e30002",
    "cross_cats_sorted": [
      "cond-mat.mtrl-sci"
    ],
    "license": "http://arxiv.org/licenses/nonexclusive-distrib/1.0/",
    "primary_cat": "physics.ins-det",
    "submitted_at": "2026-05-18T13:30:46Z",
    "title_canon_sha256": "55f24d532c2b197cd674e9b7f021de82dc119c0b841bbba65872c84b1c229787"
  },
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  "source": {
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    "kind": "arxiv",
    "version": 1
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}