A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM

Julien Guyon (LEM3); Luc Morhain (LEM3); Nabila Maloufi (LEM3); Nathalie Gey (LEM3); Nohayla El-Khairaoui (LEM3)

arxiv: 2605.18386 · v1 · pith:JNYAWNO4new · submitted 2026-05-18 · ⚛️ physics.ins-det · cond-mat.mtrl-sci

A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM

Nohayla El-Khairaoui (LEM3) , Julien Guyon (LEM3) , Nathalie Gey (LEM3) , Luc Morhain (LEM3) , Nabila Maloufi (LEM3) This is my paper

Pith reviewed 2026-05-19 23:45 UTC · model grok-4.3

classification ⚛️ physics.ins-det cond-mat.mtrl-sci

keywords direct electron detectorSEMEBSDTKDRKDKikuchi diffractionmicrostructural analysiselectron imaging

0 comments

The pith

A single orientable direct electron detector enables EBSD, RKD, TKD and imaging modes in one SEM

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

This paper presents a detection system that uses one Timepix3-based direct electron detector on an orientable support inside a scanning electron microscope. The detector can be repositioned to realize conventional electron backscatter diffraction, off-axis reflection Kikuchi diffraction, and transmission Kikuchi diffraction in on-axis, off-axis, and near-axis setups. It also supports reconstruction of images for backscattered electron imaging, electron channelling contrast imaging, and scanning transmission electron imaging in the SEM. A sympathetic reader would care because this allows multiple advanced analyses of crystal structure and defects in both bulk materials and thin foils using a single instrument and detector, without switching hardware. The approach succeeds through precise positioning combined with energy filtering and custom data post-processing to maintain pattern quality.

Core claim

The implementation of a new multi-configuration detection system integrating a single Timepix3-based direct electron detector in a scanning electron microscope enables the use of the same detector to realize all principal diffraction geometries, including conventional EBSD, off-axis RKD, and TKD in on-, off- and near-axis configurations, with transitions accomplished without hardware modification, and efficient reconstruction of electron images for BSE, ECCI and STEM-in-SEM characterizations.

What carries the argument

A single Timepix3-based direct electron detector mounted on an orientable support that allows precise translation and rotation movements to switch between diffraction geometries and imaging modes.

If this is right

High-quality Kikuchi patterns that are easily indexable can be acquired across all diffraction geometries.
Micrographs of dislocations can be obtained in both reflection and transmission modes.
Multiple advanced microstructural characterizations are possible for both bulk samples and thin foils in the same SEM.
Transitions between geometries require no hardware modification.

Where Pith is reading between the lines

These are editorial extensions of the paper, not claims the author makes directly.

This setup may allow labs to perform a wider range of analyses with reduced equipment investment.
Automated movement sequences could enable rapid mode switching for combined experiments on the same sample area.
Similar multi-configuration approaches might apply to other detector types or SEM accessories.

Load-bearing premise

Precise translation and rotation of the detector support, along with energy filtering and custom post-processing, will consistently produce high-quality indexable Kikuchi patterns and usable micrographs in all geometries without significant artifacts or loss of resolution.

What would settle it

Acquisition of Kikuchi patterns in one configuration, such as off-axis RKD, that cannot be reliably indexed or show substantial artifacts despite adjustments to detector position, energy filter settings, and post-processing steps.

read the original abstract

Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single Timepix3-based direct electron detector (DED) in a scanning electron microscope (SEM). By combining precise translation and rotation movements, this system enables, for the first time, the use of the same detector to realize all principal diffraction geometries. These include conventional Electron BackScatter Diffraction (EBSD), off-axis Reflexion Kikuchi Diffraction (RKD), and Transmission Kikuchi Diffraction (TKD) in on-, off- and near-axis configurations. Furthermore, transitions between all these geometries are accomplished without hardware modification. On the other hand, this work presents efficient reconstruction of electron images using the detector data-driven feature, extending thus its applicability to BackScattered Electron imaging (BSE), Electron Channelling Contrast Imaging (ECCI) and Scanning Transmission Electron Imaging in SEM (STEM-in-SEM) characterizations. High-quality Kikuchi patterns easily indexable were acquired across all geometries as well as micrographs of dislocations in both reflection and transmission modes. This is achieved thanks to the flexibility of the implemented detector, the optimizations made in acquisition parameters, such as energy filtering settings, and the efficiency of the developed custom approach used for electron data post-processing. Through this work, it is demonstrated that with a single DED assisted by an orientable support, it is possible to perform multiple advanced microstructural characterizations of both bulk samples and thin foils in the same SEM.

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, simulated authors' rebuttal, and a circularity audit. Tearing a paper down is the easy half of reading it; the pith above is the substance, this is the friction.

Desk Editor's Note private letter to a colleague

One detector on a movable mount covers EBSD, multiple TKD geometries, off-axis RKD, and several imaging modes in a single SEM without swaps.

read the letter

The core advance is a Timepix3 direct electron detector fixed to an orientable support that uses translation and rotation to switch between conventional EBSD, off-axis reflection Kikuchi diffraction, and on-, off-, and near-axis transmission Kikuchi diffraction, plus BSE, ECCI, and STEM-in-SEM imaging. All of this happens in one instrument with no detector changes or major hardware swaps. They report acquiring indexable Kikuchi patterns and dislocation images in both reflection and transmission modes after applying energy filtering and custom post-processing. That combination of flexibility and demonstrated output is the practical contribution worth noting. The implementation appears new relative to the setups cited in the abstract, and the fact that a single detector handles both bulk and thin-foil samples across geometries is a clear engineering step forward. The paper is an experimental instrumentation report rather than a theoretical or modeling study, so the strength rests on whether the hardware and data actually deliver usable results without hidden costs in resolution or artifacts. The abstract states that high-quality patterns were obtained, but it gives no numbers on positioning repeatability, residual distortions after movement, or direct comparisons against standard single-geometry detectors. Without those metrics it is hard to judge how consistently the system performs when users actually switch configurations day to day. The stress-test concern about precision and post-processing artifacts is reasonable given the current level of detail; if the full manuscript contains quantitative benchmarks or side-by-side images, that would address it directly. This work is aimed at materials labs that already run SEM-based diffraction and imaging and want to reduce the need for multiple detectors or frequent hardware changes. Readers who build or modify electron microscopy setups will get the most out of the implementation choices. The central claim is concrete and testable, so the paper is worth sending for peer review even if the validation section needs expansion. I would recommend it go to referees who know SEM detector mechanics and Kikuchi pattern indexing.

Referee Report

2 major / 2 minor

Summary. The paper describes the implementation of a single Timepix3-based direct electron detector (DED) mounted on an orientable support within an SEM. This system uses precise translation and rotation, energy filtering, and custom post-processing to enable switching between EBSD, off-axis RKD, and TKD in on-, off-, and near-axis configurations, as well as BSE, ECCI, and STEM-in-SEM imaging modes, all without hardware modifications. The authors report acquiring high-quality, indexable Kikuchi patterns and dislocation micrographs in both reflection and transmission for bulk samples and thin foils.

Significance. If the experimental results hold with adequate validation, this represents a practical advancement in SEM instrumentation by consolidating multiple diffraction and imaging techniques into a single detector setup. This could improve efficiency for multiscale microstructural analysis of advanced materials. The hardware demonstration of geometry transitions via an orientable support is a clear strength of the work.

major comments (2)

Abstract: The central claim that 'high-quality Kikuchi patterns easily indexable were acquired across all geometries' and that characterizations are performed 'without significant artifacts or loss of resolution' is not supported by any quantitative metrics, such as pattern quality indices, indexing success rates, resolution values, or direct comparisons to conventional single-geometry detectors. This absence is load-bearing for validating the multi-configuration performance.
Experimental setup and results: No quantitative data are provided on the achieved precision of the orientable support's translation and rotation movements, nor on residual artifacts or alignment errors when switching between geometries (e.g., EBSD to on-axis TKD). This directly affects the reliability of the claim that precise movements combined with filtering and post-processing consistently yield usable data across configurations.

minor comments (2)

Abstract: The phrase 'data-driven feature' for electron image reconstruction is unclear and should be expanded with a brief description of the method used.
The manuscript would benefit from a table summarizing the key parameters (e.g., detector positions, energy filter settings) for each geometry to improve clarity and reproducibility.

Simulated Author's Rebuttal

2 responses · 0 unresolved

We thank the referee for their positive assessment of the work's significance and for the constructive major comments. We address each point below and will revise the manuscript to strengthen the quantitative support for our claims.

read point-by-point responses

Referee: Abstract: The central claim that 'high-quality Kikuchi patterns easily indexable were acquired across all geometries' and that characterizations are performed 'without significant artifacts or loss of resolution' is not supported by any quantitative metrics, such as pattern quality indices, indexing success rates, resolution values, or direct comparisons to conventional single-geometry detectors. This absence is load-bearing for validating the multi-configuration performance.

Authors: We agree that the abstract would benefit from quantitative support. In the revised manuscript we will add specific metrics drawn from the experimental data, including indexing success rates (e.g., fraction of patterns successfully indexed by commercial software) and any available pattern-quality or resolution figures obtained from the post-processing pipeline. Where direct side-by-side comparisons with conventional detectors were not performed, we will instead reference published performance values for standard EBSD/TKD systems and note the qualitative equivalence demonstrated by our indexable patterns. These additions will be placed in both the abstract and a new results subsection. revision: yes
Referee: Experimental setup and results: No quantitative data are provided on the achieved precision of the orientable support's translation and rotation movements, nor on residual artifacts or alignment errors when switching between geometries (e.g., EBSD to on-axis TKD). This directly affects the reliability of the claim that precise movements combined with filtering and post-processing consistently yield usable data across configurations.

Authors: We acknowledge the value of explicit precision figures. The revised methods section will state the manufacturer-specified repeatability of the translation and rotation stages (sub-micron and sub-degree, respectively) and will report the empirical alignment residuals measured during geometry switches, including any observed image shifts that were subsequently corrected by the data-driven post-processing routine. We will also add a short discussion of how energy filtering and software alignment together suppress residual artifacts, supported by example difference images before and after correction. revision: yes

Circularity Check

0 steps flagged

No circularity: experimental instrumentation report without derivations or fitted predictions

full rationale

The paper reports hardware implementation of a single DED on an orientable support in SEM, with empirical acquisition of Kikuchi patterns and micrographs across EBSD, RKD, TKD, BSE, ECCI and STEM-in-SEM modes. No mathematical derivations, equations, parameter fitting, or predictions appear in the provided text or abstract. Central claims rest on observed data and custom post-processing rather than any self-referential reduction. The work is self-contained against external benchmarks of detector performance and diffraction quality; no load-bearing self-citations or ansatzes are invoked. This is the expected non-finding for pure instrumentation papers.

Axiom & Free-Parameter Ledger

0 free parameters · 1 axioms · 0 invented entities

This experimental instrumentation paper introduces no new free parameters, axioms beyond standard SEM physics, or invented entities; the central claim rests on the mechanical flexibility of the orientable support and the performance of the Timepix3 detector plus custom software.

axioms (1)

domain assumption Standard assumptions of electron diffraction and imaging in SEM (e.g., sufficient beam coherence and detector sensitivity for Kikuchi pattern formation)
Invoked implicitly when claiming high-quality indexable patterns across geometries.

pith-pipeline@v0.9.0 · 5847 in / 1247 out tokens · 22098 ms · 2026-05-19T23:45:32.118857+00:00 · methodology

discussion (0)

Lean theorems connected to this paper

Citations machine-checked in the Pith Canon. Every link opens the source theorem in the public Lean library.

IndisputableMonolith/Foundation/RealityFromDistinction.lean reality_from_one_distinction unclear

?

unclear
Relation between the paper passage and the cited Recognition theorem.

By combining precise translation and rotation movements, this system enables... all principal diffraction geometries... without hardware modification.
IndisputableMonolith/Cost/FunctionalEquation.lean washburn_uniqueness_aczel unclear

?

unclear
Relation between the paper passage and the cited Recognition theorem.

High-quality Kikuchi patterns easily indexable were acquired across all geometries... via energy filtering settings and... custom approach used for electron data post-processing.

What do these tags mean?

matches: The paper's claim is directly supported by a theorem in the formal canon.
supports: The theorem supports part of the paper's argument, but the paper may add assumptions or extra steps.
extends: The paper goes beyond the formal theorem; the theorem is a base layer rather than the whole result.
uses: The paper appears to rely on the theorem as machinery.
contradicts: The paper's claim conflicts with a theorem or certificate in the canon.
unclear: Pith found a possible connection, but the passage is too broad, indirect, or ambiguous to say the theorem truly supports the claim.

Reference graph

Works this paper leans on

22 extracted references · 22 canonical work pages

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Schwartz, M

A.J. Schwartz, M. Kumar, B.L. Adams, D.P. Field, eds., Electron Backscatter Diffraction in Ma- terials Science, Springer US, Boston, MA, 2009. https://doi.org/10.1007/978-0-387-88136-2

work page doi:10.1007/978-0-387-88136-2 2009
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M.A. Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using elec- tron channeling contrast, Microscopy Res & Techniqu e 69 (2006) 374 –381. https://doi.org/10.1002/jemt.20293

work page doi:10.1002/jemt.20293 2006
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Mansour, M.A

H. Mansour, M.A. Crimp, N. Gey, X. Iltis, N. Maloufi, Dislocation analysis of a complex sub - grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scan- ning electr on microscope, Ceramics International 45 (2019) 18666 –18671. https://doi.org/10.1016/j.ceramint.2019.06.091

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R.R. Keller, R.H. Geiss, Transmission EBSD from 10 nm domains in a scanning electron micro- scope, Journal of Microscopy 245 (2012) 245 –251. http s://doi.org/10.1111/j.1365- 2818.2011.03566.x

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F. Niessen, A. Burrows, A.B.D.S. Fanta, A systematic comparison of on-axis and off-axis trans- mission Kikuchi diffraction, Ultramicroscopy 186 (2018) 158 –170. https://doi.org/10.1016/j.ul- tramic.2017.12.017

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E. Brodu, E. Bouzy, J.-J. Fundenberger, Diffraction contrast dependence on sample thickness and incident energy in on -axis Transmission Kikuchi Diffraction in SEM, Ultramicroscopy 181 (2017) 123–133. https://doi.org/10.1016/j.ultramic.2017.04.017

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G. McMullan, A.R. Faruqi, R. Henderson, Direct Electron Detectors, in: Methods in Enzymology, Elsevier, 2016: pp. 1–17. https://doi.org/10.1016/bs.mie.2016.05.056. 12

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Poikela, J

T. Poikela, J. Plosila, T. Westerlund, M. Campbell, M.D. Gaspari, X. Llopart, V. Gromov, R. Kluit, M.V. Beuzekom, F. Zappon, V. Zivkovic, C. Brezina, K. Desch, Y. Fu, A. Kruth, Timepix3: a 65K channel hybrid pixel readout chip with simultaneous ToA/ToT and sparse readout, J. Inst. 9 (2014) C05013–C05013. https://doi.org/10.1088/1748-0221/9/05/C05013

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T. Vystavěl, P. Stejskal, M. Unčovský, C. Stephens, Tilt -free EBSD, Microsc Microanal 24 (2018) 1126–1127. https://doi.org/10.1017/S1431927618006116

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Marshall, J

A.L. Marshall, J. Holzer, P. Stejskal, C.J. Stephens, T. Vystavěl, M.J. Whiting, The EBSD spatial resolution of a Timepix -based detector in a tilt -free geometry, Ultramicroscopy 226 (2021) 113294. https://doi.org/10.1016/j.ultramic.2021.113294

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K.P. Mingard, M. Stewart, M.G. Gee, S. Vespucci, C. Trager -Cowan, Practical application of direct electron detectors to EBSD mapping in 2D and 3D, Ultramicroscopy 184 (2018) 242–251. https://doi.org/10.1016/j.ultramic.2017.09.008

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Zhang, T

T. Zhang, T. Britton, Multi -exposure diffraction pattern fusion applied to enable wider -angle transmission Kikuchi diffraction with direct electron detectors, Ultramicroscopy 257 (2024) 113902. https://doi.org/10.1016/j.ultramic.2023.113902

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Vespucci, A

S. Vespucci, A. Winkelmann, K. Mingard, D. Maneuski, V. O’Shea, C. Trager-Cowan, Exploring transmission Kikuchi diffraction using a Timepix detector, J. Inst. 12 (2017) C02075 –C02075. https://doi.org/10.1088/1748-0221/12/02/C02075

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T. Zhang, L. Berners, J. Holzer, T.B. Britton, Comparison of Kikuchi diffraction geometries in the scanning electron microscope, Materials Characterization 222 (2025) 114853. https://doi.org/10.1016/j.matchar.2025.114853

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D. Chatterjee, J. Wei, A. Kvit, B. Bammes, B. Levin, R. Bilhorn, P. Voyles, An Ultrafast Direct Electron Camera for 4D STEM, Microsc Microanal 27 (2021) 1004 –1006. https://doi.org/10.1017/S1431927621003809

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Mansour, J

H. Mansour, J. Guyon, M.A. Crimp, N. Gey, B. Beausir, N. Maloufi, Accurate electron channeling contrast analysis of dislocations in fine grained bulk materials, Scripta Materialia 84 –85 (2014) 11–14. https://doi.org/10.1016/j.scriptamat.2014.03.001

work page doi:10.1016/j.scriptamat.2014.03.001 2014

[1] [1]

Schwartz, M

A.J. Schwartz, M. Kumar, B.L. Adams, D.P. Field, eds., Electron Backscatter Diffraction in Ma- terials Science, Springer US, Boston, MA, 2009. https://doi.org/10.1007/978-0-387-88136-2

work page doi:10.1007/978-0-387-88136-2 2009

[2] [2]

Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using elec- tron channeling contrast, Microscopy Res & Techniqu e 69 (2006) 374 –381

M.A. Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using elec- tron channeling contrast, Microscopy Res & Techniqu e 69 (2006) 374 –381. https://doi.org/10.1002/jemt.20293

work page doi:10.1002/jemt.20293 2006

[3] [3]

Mansour, M.A

H. Mansour, M.A. Crimp, N. Gey, X. Iltis, N. Maloufi, Dislocation analysis of a complex sub - grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scan- ning electr on microscope, Ceramics International 45 (2019) 18666 –18671. https://doi.org/10.1016/j.ceramint.2019.06.091

work page doi:10.1016/j.ceramint.2019.06.091 2019

[4] [4]

Han, B., Li, Y ., & Li, G.,

R.R. Keller, R.H. Geiss, Transmission EBSD from 10 nm domains in a scanning electron micro- scope, Journal of Microscopy 245 (2012) 245 –251. http s://doi.org/10.1111/j.1365- 2818.2011.03566.x

work page doi:10.1111/j.1365- 2012

[5] [5]

https://analyticalscience.wiley.com/content/ar- ticle-do/stem-in-sem-re-emerging-material-measurement-approach (accessed March 19, 2026)

STEM-in-SEM: A re -emerging material measurement approach - 2022 - Wiley Analytical Sci- ence, Analytical Science Article DO Series (n.d.). https://analyticalscience.wiley.com/content/ar- ticle-do/stem-in-sem-re-emerging-material-measurement-approach (accessed March 19, 2026)

work page 2022

[6] [6]

Niessen, A

F. Niessen, A. Burrows, A.B.D.S. Fanta, A systematic comparison of on-axis and off-axis trans- mission Kikuchi diffraction, Ultramicroscopy 186 (2018) 158 –170. https://doi.org/10.1016/j.ul- tramic.2017.12.017

work page doi:10.1016/j.ul- 2018

[7] [7]

Brodu, E

E. Brodu, E. Bouzy, J.-J. Fundenberger, Diffraction contrast dependence on sample thickness and incident energy in on -axis Transmission Kikuchi Diffraction in SEM, Ultramicroscopy 181 (2017) 123–133. https://doi.org/10.1016/j.ultramic.2017.04.017

work page doi:10.1016/j.ultramic.2017.04.017 2017

[8] [8]

McMullan, A.R

G. McMullan, A.R. Faruqi, R. Henderson, Direct Electron Detectors, in: Methods in Enzymology, Elsevier, 2016: pp. 1–17. https://doi.org/10.1016/bs.mie.2016.05.056. 12

work page doi:10.1016/bs.mie.2016.05.056 2016

[9] [9]

Levin, Direct detectors and their applications in electron microscopy for materials science, J

B.D.A. Levin, Direct detectors and their applications in electron microscopy for materials science, J. Phys. Mater. 4 (2021) 042005. https://doi.org/10.1088/2515-7639/ac0ff9

work page doi:10.1088/2515-7639/ac0ff9 2021

[10] [10]

Poikela, J

T. Poikela, J. Plosila, T. Westerlund, M. Campbell, M.D. Gaspari, X. Llopart, V. Gromov, R. Kluit, M.V. Beuzekom, F. Zappon, V. Zivkovic, C. Brezina, K. Desch, Y. Fu, A. Kruth, Timepix3: a 65K channel hybrid pixel readout chip with simultaneous ToA/ToT and sparse readout, J. Inst. 9 (2014) C05013–C05013. https://doi.org/10.1088/1748-0221/9/05/C05013

work page doi:10.1088/1748-0221/9/05/c05013 2014

[11] [11]

Wilkinson, G

A.J. Wilkinson, G. Moldovan, T.B. Britton, A. Bewick, R. Clough, A.I. Kirkland, Direct Detec- tion of Electron Backscatter Diffraction Patterns, Phys. Rev. Lett. 111 (2013) 065506. https://doi.org/10.1103/PhysRevLett.111.065506

work page doi:10.1103/physrevlett.111.065506 2013

[12] [12]

Vespucci, A

S. Vespucci, A. Winkelmann, G. Naresh-Kumar, K.P. Mingard, D. Maneuski, P.R. Edwards, A.P. Day, V. O’Shea, C. Trager -Cowan, Digital direct electron imaging of energy -filtered electron backscatter diffraction patterns, Phys. Rev. B 92 (2015) 205301. https://doi.org/10.1103/PhysRevB.92.205301

work page doi:10.1103/physrevb.92.205301 2015

[13] [13]

Vystavěl, P

T. Vystavěl, P. Stejskal, M. Unčovský, C. Stephens, Tilt -free EBSD, Microsc Microanal 24 (2018) 1126–1127. https://doi.org/10.1017/S1431927618006116

work page doi:10.1017/s1431927618006116 2018

[14] [14]

Marshall, J

A.L. Marshall, J. Holzer, P. Stejskal, C.J. Stephens, T. Vystavěl, M.J. Whiting, The EBSD spatial resolution of a Timepix -based detector in a tilt -free geometry, Ultramicroscopy 226 (2021) 113294. https://doi.org/10.1016/j.ultramic.2021.113294

work page doi:10.1016/j.ultramic.2021.113294 2021

[15] [15]

Holzer, A

J. Holzer, A. Marshall, P. Stejskal, C. Stephens, T. Vystavěl, Large area EBSD mapping using a tilt-free configuration and direct electron detection sensor, Microsc Microanal 27 (2021) 1832 –

work page 2021

[16] [16]

https://doi.org/10.1017/S143192762100670X

work page doi:10.1017/s143192762100670x

[17] [17]

Mingard, M

K.P. Mingard, M. Stewart, M.G. Gee, S. Vespucci, C. Trager -Cowan, Practical application of direct electron detectors to EBSD mapping in 2D and 3D, Ultramicroscopy 184 (2018) 242–251. https://doi.org/10.1016/j.ultramic.2017.09.008

work page doi:10.1016/j.ultramic.2017.09.008 2018

[18] [18]

Zhang, T

T. Zhang, T. Britton, Multi -exposure diffraction pattern fusion applied to enable wider -angle transmission Kikuchi diffraction with direct electron detectors, Ultramicroscopy 257 (2024) 113902. https://doi.org/10.1016/j.ultramic.2023.113902

work page doi:10.1016/j.ultramic.2023.113902 2024

[19] [19]

Vespucci, A

S. Vespucci, A. Winkelmann, K. Mingard, D. Maneuski, V. O’Shea, C. Trager-Cowan, Exploring transmission Kikuchi diffraction using a Timepix detector, J. Inst. 12 (2017) C02075 –C02075. https://doi.org/10.1088/1748-0221/12/02/C02075

work page doi:10.1088/1748-0221/12/02/c02075 2017

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