REVIEW 2 cited by
Improved Sample Complexities for Deep Networks and Robust Classification via an All-Layer Margin
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Improved Sample Complexities for Deep Networks and Robust Classification via an All-Layer Margin
read the original abstract
For linear classifiers, the relationship between (normalized) output margin and generalization is captured in a clear and simple bound -- a large output margin implies good generalization. Unfortunately, for deep models, this relationship is less clear: existing analyses of the output margin give complicated bounds which sometimes depend exponentially on depth. In this work, we propose to instead analyze a new notion of margin, which we call the "all-layer margin." Our analysis reveals that the all-layer margin has a clear and direct relationship with generalization for deep models. This enables the following concrete applications of the all-layer margin: 1) by analyzing the all-layer margin, we obtain tighter generalization bounds for neural nets which depend on Jacobian and hidden layer norms and remove the exponential dependency on depth 2) our neural net results easily translate to the adversarially robust setting, giving the first direct analysis of robust test error for deep networks, and 3) we present a theoretically inspired training algorithm for increasing the all-layer margin. Our algorithm improves both clean and adversarially robust test performance over strong baselines in practice.
Forward citations
Cited by 2 Pith papers
-
Flat Minima and Generalization: Insights from Stochastic Convex Optimization
In smooth stochastic convex optimization, flat empirical minima can incur constant population risk while sharp minima generalize optimally, and sharpness-aware algorithms can converge to such bad flat minima.
-
Muon Learns More Robust and Transferable Features than Adam
Muon learns more robust and transferable features than Adam and SGD, shown via corruption robustness tests, transfer experiments, layer-wise probes, effective rank measurements, and a theoretical proof on margins in a...
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.