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Testing the Kerr black hole hypothesis using X-ray reflection spectroscopy and a thin disk model with finite thickness

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arxiv 2003.09663 v2 pith:FOAHGJYE submitted 2020-03-21 astro-ph.HE gr-qc

Testing the Kerr black hole hypothesis using X-ray reflection spectroscopy and a thin disk model with finite thickness

Askar B. Abdikamalov , Dimitry Ayzenberg , Cosimo Bambi , Thomas Dauser , Javier A. Garcia , Sourabh Nampalliwar , Ashutosh Tripathi , Menglei Zhou This is my paper
classification astro-ph.HE gr-qc
keywords blackdiskreflectionaccretionmodelthicknessx-rayfinite
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X-ray reflection spectroscopy is a powerful tool for probing the strong gravity region of black holes and can be used for testing general relativity in the strong field regime. Simplifications of the available relativistic reflection models limit the capability of performing accurate measurements of the properties of black holes. In this paper, we present an extension of the model RELXILL_NK in which the accretion disk has a finite thickness rather than being infinitesimally thin. We employ the accretion disk geometry proposed by Taylor & Reynolds (2018) and we construct relativistic reflection models for different values of the mass accretion rate of the black hole. We apply the new model to high quality Suzaku data of the X-ray binary GRS 1915+105 to explore the impact of the thickness of the disk on tests of the Kerr metric.

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Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. Testing non-circular black hole spacetime with X-ray reflection

    gr-qc 2026-02 conditional novelty 6.0

    X-ray reflection data for EXO 1846–031 cannot distinguish the non-circular deformation parameter ℓ_NP from zero, remaining consistent with the Kerr hypothesis.

  2. Physics and Astrophysics of Black Holes with eXTP

    astro-ph.HE 2026-07 accept novelty 2.0

    eXTP’s larger effective area and simultaneous polarimetry will tighten black-hole spin and Kerr-deviation constraints relative to NICER for the same exposure.