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Sample optimal Quantum identity testing via Pauli Measurements
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Sample optimal Quantum identity testing via Pauli Measurements
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In this paper, we show that $\Theta(\mathrm{poly}(n)\cdot\frac{4^n}{\epsilon^2})$ is the sample complexity of testing whether two $n$-qubit quantum states $\rho$ and $\sigma$ are identical or $\epsilon$-far in trace distance using two-outcome Pauli measurements.
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Cited by 1 Pith paper
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An Optimal Analysis of the Product Test
For every n >= 2, the product test's worst-case acceptance probability equals (1 + mω^2 + (1−mω)^2)/2 with m = floor(1/ω), where ω is the maximum squared overlap with a product state.
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