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Exploring Intrinsic Normal Prototypes within a Single Image for Universal Anomaly Detection

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arxiv 2503.02424 v2 pith:TY3VQ4SN submitted 2025-03-04 cs.CV

classification cs.CV
keywords normalimageinp-formerinpsanomaliesanomalydetectioninformation
verification ladder T0 review T1 audit T2 compute T3 formal
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Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.

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Cited by 3 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Center-aware Residual Anomaly Synthesis for Multi-class Industrial Anomaly Detection

    cs.CV 2025-05 conditional novelty 6.0 of 10

    CRAS is a unified multi-class industrial anomaly detection method whose center-aware residual features and distance-guided synthetic anomalies reach 98.3% image-level AUROC on MVTec AD.

  2. Multi-View Reconstruction with Global Context for 3D Anomaly Detection

    cs.CV 2025-07 conditional novelty 5.0 of 10

    MVR projects high-resolution point clouds into multi-view depth images and reconstructs them with a pre-trained vision transformer, achieving state-of-the-art anomaly detection scores on Real3D-AD.

  3. A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects

    cs.CV 2025-07 conditional novelty 3.0 of 10

    A broad survey of industrial defect detection that structures the field by closed-set vs open-set and 2D vs 3D methods, with an emphasis on the rise of open-set anomaly detection.

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