pith. sign in

arxiv: 2507.17803 · v3 · pith:RVSGY6LXnew · submitted 2025-07-23 · ✦ hep-ph · hep-ex

The Dark Side of a Tera-Z Factory

classification ✦ hep-ph hep-ex
keywords darkmatterfutureindirectphysicstera-testsanalyse
0
0 comments X
read the original abstract

The future circular $e^+e^-$ collider (FCC-ee or CEPC) will provide unprecedented sensitivity to indirect new physics signals emerging as small deviations from the Standard Model predictions in electroweak precision tests. Assuming new physics scenarios containing a dark matter candidate and a $t$-channel mediator, we analyse the synergy and interplay of future Tera-$Z$ factories and non-collider tests conducted through direct and indirect searches of dark matter. Our results highlight the excellent prospect for a Tera-$Z$ run to indirectly probe the presence and nature of dark matter.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. When Two Loops Matter: Electroweak Precision in the SMEFT

    hep-ph 2026-04 unverdicted novelty 7.0

    A modification to the top-Higgs Yukawa coupling in SMEFT induces a two-loop shift in the W mass through a large anomalous dimension, providing a new indirect probe via electroweak precision observables.