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Pith Integrity · Reference Change Desk · events-only

Reference changes

See every place this corpus cites a work that was later retracted, corrected, withdrawn, or placed under expression of concern: exact quote, event source, and what happened next. No model judges the citation.

A notice on this page means a citing paper's bibliography includes a work with a published scholarly-record event. It is not a judgment on the citing paper.

Scoped to citing paper 2605.24157 · clear

01Events with corpus notices

02One-hop citation notices (secondary index)

Correction Crossref Open
Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes

cites 2024 , volume = · ref [6] · event 2025-04-24 · 2605.24157 · event page · DOI 10.1080/13183222.2024.2383905

Raw extraction · bibliography line

May, A.; Rommel, M.; Baier, L.; Schraml, M.; Dick, J. F.; Jank, M. P. M.; Schulze, J. A 4H- SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C. 2024 Smart Systems Integration Conference and Exhibition (SSI), Hamburg, Germany, 2024, 1 – 5, DOI:10.1109/SSI63222.2024.10740550