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Anisotropic MagnetoMemristance

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arxiv 2109.05101 v3 pith:5HEJYN3D submitted 2021-09-10 cond-mat.mes-hall cond-mat.softcond-mat.stat-mechnlin.PS

classification cond-mat.mes-hallcond-mat.softcond-mat.stat-mechnlin.PS
keywords anisotropicmagneticcurrent-induceddevicesfactorslayermemristanceresults
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In the last decade, nanoscale resistive devices with memory have been the subject of intense study because of their possible use in brain-inspired computing. However, operational endurance is one of the limiting factors in the adoption of such technology. For this reason, we discuss the emergence of current-induced memristance in magnetic materials, known for their durability. We show analytically and numerically that a single ferromagnetic layer can possess GHz memristance, due to a combination of two factors: a current-induced transfer of angular momentum (Zhang-Li torque) and the anisotropic magnetoresistance (AMR). We term the resulting effect the anisotropic magneto-memristance (AMM). We connect the AMM to the topology of the magnetization state, within a simple model of a 1-dimensional annulus-shaped magnetic layer, confirming the analytical results with micromagnetic simulations for permalloy. Our results open a new path towards the realization of single-layer magnetic memristive devices operating at GHz frequencies.

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