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Scanning microscopies of superconductors at very low temperatures

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arxiv 1201.1868 v1 pith:N5N2XQWA submitted 2012-01-09 cond-mat.supr-con cond-mat.mes-hall

Scanning microscopies of superconductors at very low temperatures

V. Crespo , A. Maldonado , J. A. Galvis , P. Kulkarni , I. Guillamon , J. G. Rodrigo , H. Suderow , S. Vieira
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S. Banerjee P. Rodiere
This is my paper
classification cond-mat.supr-con cond-mat.mes-hall
keywords samplescanningsuperconductingandreevdiscussmethodreflectionspectroscopy
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We discuss basics of scanning tunneling microscopy and spectroscopy (STM/S) of the superconducting state with normal and superconducting tips. We present a new method to measure the local variations in the Andreev reflection amplitude between a superconducting tip and the sample. This method is termed Scanning Andreev Reflection Spectroscopy (SAS). We also briefly discuss vortex imaging with STM/S under an applied current through the sample, and show the vortex lattice as a function of the angle between the magnetic field and sample's surface.

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