REVIEW
Superconducting charge sensor coupled to an electron layer in silicon
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Superconducting charge sensor coupled to an electron layer in silicon
read the original abstract
Schemes aimed at transferring individual electrons in semiconductor devices and detecting possible transfer errors have increasing importance for metrological applications. We study the coupling of a superconducting Josephson-junction-based charge detector to an electron island defined by field-effect in silicon. The flexibility of our device allows one to tune the coupling using the detector as an additional gate electrode. We study the reliability of the electron sensor in different device configurations and the suitability of various operation modes for error detection in electron pumping experiments. As a result, we obtain a charge detection bandwidth of 5.87 kHz with unity signal to noise ratio at 300 mK bath temperature.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.