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Semi-supervised Learning using Adversarial Training with Good and Bad Samples
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Semi-supervised Learning using Adversarial Training with Good and Bad Samples
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In this work, we investigate semi-supervised learning (SSL) for image classification using adversarial training. Previous results have illustrated that generative adversarial networks (GANs) can be used for multiple purposes. Triple-GAN, which aims to jointly optimize model components by incorporating three players, generates suitable image-label pairs to compensate for the lack of labeled data in SSL with improved benchmark performance. Conversely, Bad (or complementary) GAN, optimizes generation to produce complementary data-label pairs and force a classifier's decision boundary to lie between data manifolds. Although it generally outperforms Triple-GAN, Bad GAN is highly sensitive to the amount of labeled data used for training. Unifying these two approaches, we present unified-GAN (UGAN), a novel framework that enables a classifier to simultaneously learn from both good and bad samples through adversarial training. We perform extensive experiments on various datasets and demonstrate that UGAN: 1) achieves state-of-the-art performance among other deep generative models, and 2) is robust to variations in the amount of labeled data used for training.
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