Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
As of 12 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 4 inbound Pith citation observations for arXiv:2004.10709.
A citation records a reference. It does not transfer a finding from one paper to another.
Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-12T06:34:41.77262+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-10T21:28:34.727588Z
A source-named dated measurement, never combined with another source.
Source: arxiv_reference, observed 2026-05-18T00:55:33.577203Z
0 of 0 outbound references displayed
External citation measurements
No source-named external measurement is stored.
No outbound reference observations are available for this paper version.
Observation 8b679ea8-4b1c-4844-b548-752025efb07e · inbound
Probing Supernova Neutrino Boosted Dark Matter with Collective Excitation Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes
Reference 126
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation b103ce3c-14ec-4c61-954f-e3a40b19ed68 · inbound
SPLENDOR: a novel detector platform to search for light dark matter with narrow-gap semiconductors Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes
Reference 100
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation d9991ab4-213f-4d45-b03e-095cde700d77 · inbound
Direct Detection of Leptophobic Dark Matter with Electronic Collective Excitations Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes
Reference 101
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 974016df-ae51-41b0-bfd6-d7d4ebbf910e · inbound
Underground Production of Electromagnetic Dark States by MeV-scale Electron Beams and Detection with CCDs Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes
Reference 70
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.