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Paper Citation Record · LEDGER

Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes

As of 12 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 4 inbound Pith citation observations for arXiv:2004.10709.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2004.10709 v2

Coverage vector

measured 0 of 0 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links

measured 4 of 4 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-12T06:34:41.77262+00:00

measured 4 of 4 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-10T21:28:34.727588Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: arxiv_reference, observed 2026-05-18T00:55:33.577203Z

Reference resolution

0 of 0 outbound references displayed

  • verified exact0
  • verified fuzzy0
  • unresolved0
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

No outbound reference observations are available for this paper version.

Pith citing papers

Observation 8b679ea8-4b1c-4844-b548-752025efb07e · inbound

Probing Supernova Neutrino Boosted Dark Matter with Collective Excitation cites this paper.

Probing Supernova Neutrino Boosted Dark Matter with Collective Excitation Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes

Reference 126

Resolution
unresolved
no resolver link, observed 2026-08-10T21:28:34.727588Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:28:34.727588Z digest=sha256:eb8d4178292efa2ad65dcf5dc993ef7340325f6afad2fd2bbb070372059e60b7

Observation b103ce3c-14ec-4c61-954f-e3a40b19ed68 · inbound

SPLENDOR: a novel detector platform to search for light dark matter with narrow-gap semiconductors cites this paper.

SPLENDOR: a novel detector platform to search for light dark matter with narrow-gap semiconductors Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes

Reference 100

Resolution
unresolved
no resolver link, observed 2026-08-06T15:00:44.649021Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-06T15:00:44.649021Z digest=sha256:c9b797fc69353599c7344a4454f7916e566c2f25f558f80c9e1e71ba69e4f86e

Observation d9991ab4-213f-4d45-b03e-095cde700d77 · inbound

Direct Detection of Leptophobic Dark Matter with Electronic Collective Excitations cites this paper.

Direct Detection of Leptophobic Dark Matter with Electronic Collective Excitations Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes

Reference 101

Resolution
unresolved
no resolver link, observed 2026-08-04T08:57:12.810467Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-04T08:57:12.810467Z digest=sha256:73c99f3adef8dd2c4a4491eab52a6784f6177a5ff23502f0f380fd9b58c9fa40

Observation 974016df-ae51-41b0-bfd6-d7d4ebbf910e · inbound

Underground Production of Electromagnetic Dark States by MeV-scale Electron Beams and Detection with CCDs cites this paper.

Underground Production of Electromagnetic Dark States by MeV-scale Electron Beams and Detection with CCDs Ionization Yield in Silicon for eV-Scale Electron-Recoil Processes

Reference 70

Resolution
verified exact
arxiv_id, observed 2026-05-18T00:55:33.579537Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-05-18T00:55:03.483583Z digest=sha256:a5b51b5f75b87eeef61c3693b8b991091486af5f2b03710a6bc3aa31909229b8