Pith. sign in

REVIEW 2 cited by

The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy

Not yet reviewed by Pith; the record is open.

Re-run · record.json Download PDF Read on arXiv ↗

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2305.11961 v1 pith:K732YNP4 submitted 2023-05-19 physics.ins-det cond-mat.mtrl-sci

Peter Ercius , Ian J. Johnson , Philipp Pelz , Benjamin H. Savitzky , Lauren Hughes , Hamish G. Brown , Steven E. Zeltmann , Shang-Lin Hsu
show 14 more authors
Cassio C.S. Pedroso Bruce E. Cohen Ramamoorthy Ramesh David Paul John M. Joseph Thorsten Stezelberger Cory Czarnik Matthew Lent Erin Fong Jim Ciston Mary C. Scott Colin Ophus Andrew M. Minor and Peter Denes
This is my paper · ORCID
classification physics.ins-detcond-mat.mtrl-sci
keywords electrondatadetectorscanningcameramicroscopypixelresulting
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
read the original abstract

We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 - 300 keV. Through electron counting, the resulting sparse data sets are reduced in size by 10 - 300x compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex 4D-STEM experiments to be accomplished with typical STEM scanning parameters.

Discussion (0). Continue with ORCID to comment.

Forward citations

Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Guided progressive reconstructive imaging: a new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography

    physics.app-ph 2025-12 conditional novelty 6.0 of 10

    Ptychographic phase reconstruction can be decomposed into a sum of precomputed single-electron contributions, enabling linear-complexity, event-wise direct phase retrieval.

  2. Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials

    physics.app-ph 2025-01 conditional novelty 6.0 of 10

    Analytical ptychography can image beam-sensitive specimens at very low electron doses, with dose requirement proportional to the reconstructed frequency surface and comparable per-frequency dose efficiency across WDD,...

Pith tools