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Simple coplanar waveguide resonator mask targeting metal-substrate interface

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arxiv 2204.07202 v1 pith:2KHZIDPA submitted 2022-04-14 quant-ph physics.app-ph

Simple coplanar waveguide resonator mask targeting metal-substrate interface

classification quant-ph physics.app-ph
keywords maskcomparisonsdevicesinterfacemetal-substrateaccurateboulder-cryogenic-quantum-testbedcommunity
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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This white paper presents a single-layer mask, found at https://github.com/Boulder-Cryogenic-Quantum-Testbed/simple-resonator-mask. It is designed for fabrication of superconducting microwave resonators towards 1:1 comparisons of dielectric losses from the metal-substrate interface. Finite-element electromagnetic simulations are used to determine participation ratios of the four major regions of the on-chip devices, as well as to confirm lack of crosstalk between neighboring devices and demonstrate coupling tunability over three orders of magnitude. This mask is intended as an open-source community resource for facilitating precise and accurate comparisons of materials in the single-photon, millikelvin regime.

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Cited by 3 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. Resist-free shadow deposition using silicon trenches for Josephson junctions in superconducting qubits

    quant-ph 2026-04 unverdicted novelty 7.0

    A resist-free silicon-trench shadow deposition method fabricates Al-AlOx-Al Josephson junctions and qubits with median relaxation times up to 184 microseconds and minimal substrate-metal contamination.

  2. Resist-free shadow deposition using silicon trenches for Josephson junctions in superconducting qubits

    quant-ph 2026-04 conditional novelty 7.0

    Resist-free shadow deposition via etched silicon trenches produces Al-AlOx-Al Josephson junctions with median qubit energy relaxation times of 184 microseconds and minimal substrate-metal interface contamination.

  3. Fabrication effects on Niobium oxidation and surface contamination in Niobium-metal bilayers using X-ray photoelectron spectroscopy

    cond-mat.mtrl-sci 2026-01 unverdicted novelty 4.0

    XPS evaluation of 17 capping layers identifies resilient options that limit niobium oxidation during standard fabrication and improve microwave resonator performance.