Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-10T20:21:09.713485Z
Paper Citation Record · LEDGER
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
As of 11 August 2026, this Paper Citation Record lists 100 of 238 outbound references and 1 inbound Pith citation observation for arXiv:2501.08874.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-11T06:34:44.6726+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-03T15:20:32.382873Z
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
100 of 238 outbound references displayed
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- verified fuzzy0
- unresolved71
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External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 20d26d7a-19c8-472a-9782-b01726929a53 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 1
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation e56253ae-aa70-49cc-aa71-13f180005e23 · outbound
This paper cites Lazi´ c, M.
Reference 2
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Source-reported events for the cited work
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Observation db62ad7a-818f-48f2-962b-8ef91bbcda1f · outbound
This paper cites M¨ uller-Caspary, M.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials M¨ uller-Caspary, M
Reference 3
- Resolution
- verified exact
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 43b11541-3a49-4b03-993a-5518c881632e · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 4
- Resolution
- verified exact
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 92bc6eab-3490-4ee2-87dc-a013d1e94608 · outbound
This paper cites Chen, T.-C.
Reference 5
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 5b42a9ec-5d1d-4f85-927b-fdc8ec8aba3c · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 6
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 6ef088e5-5807-44da-8c16-3a71be7c2012 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 7
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 3db866d0-46ac-4d2d-8ce7-601d67192349 · outbound
This paper cites Zhang, G.
Reference 8
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 93c1098b-396f-4475-878a-0a59b2258ea8 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 9
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation bd300989-da94-4eca-b4ad-ed7022b52888 · outbound
This paper cites Mitsuishi, K.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Mitsuishi, K
Reference 10
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 88f9bcd1-d0f1-4b84-a21b-0aef96b48edf · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 11
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation f665f86f-0124-470c-9651-a6c097655126 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 12
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation b8f78498-fc27-48ea-b448-350db5b6c42c · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 13
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 29882ef9-537d-4536-bf0c-0ef74273133b · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 14
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 6ae0f5d5-7370-4e1a-9afa-d46801595935 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 15
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 1e1e4b3f-da28-4181-8378-149b49dbc786 · outbound
This paper cites Scheid, Y.
Reference 16
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation c9eae4ad-7383-4550-898c-8c38b65798ba · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 17
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 70743487-399c-4349-b15e-435bfc8ce25d · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 18
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation aa211e8c-f45f-4ec3-af7f-17184f8ba812 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 19
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 40e0dc8a-b64f-49d4-8f34-5cccbfe87391 · outbound
This paper cites Egerton, Radiation damage to organic and inorganic specimens in the TEM, Micron 119 (January) (2019) 72–87.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Egerton, Radiation damage to organic and inorganic specimens in the TEM, Micron 119 (January) (2019) 72–87
Reference 20
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 791b9e6b-571c-4fec-9321-7c62050a0f55 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 22
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 8afcf6ce-19d4-4a44-8d82-64b8080dd19f · outbound
This paper cites Bornes, W.
Reference 23
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 599c2b57-c5b1-455d-b7e6-adfd127a12c2 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 24
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 164143b0-bc8e-4609-87b4-3575452bcb44 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 25
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation e78d3e1c-61f9-4884-80f8-151d44ba5163 · outbound
This paper cites Egerton, Limits to the spatial, energy and mo- mentum resolution of electron energy-loss spec- troscopy, Ultramicroscopy 107 (8) (2007) 575–586.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Egerton, Limits to the spatial, energy and mo- mentum resolution of electron energy-loss spec- troscopy, Ultramicroscopy 107 (8) (2007) 575–586
Reference 26
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 9a85dc42-706a-4352-bc15-e81ae2759810 · outbound
This paper cites Rez, Coherent and incoherent imaging of bi- ological specimens with electrons and X-rays, Ultramicroscopy 231 (2021) 113301.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Rez, Coherent and incoherent imaging of bi- ological specimens with electrons and X-rays, Ultramicroscopy 231 (2021) 113301
Reference 27
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 2491da15-8e01-4dfc-ac75-5d9994076c90 · outbound
This paper cites McMullan, D.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials McMullan, D
Reference 28
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation c6fce3a4-3624-42c4-b4b8-43c33bd3c88c · outbound
This paper cites Llopart, R.
Reference 29
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation d5712b09-bdeb-48e5-b657-3e79871a848a · outbound
This paper cites Ballabriga, M.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Ballabriga, M
Reference 30
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 27e661ca-8e0b-4321-87ee-567136814530 · outbound
This paper cites Plackett, I.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Plackett, I
Reference 31
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation e80c66da-2d76-4d7d-9ba6-0f6b5c8c7787 · outbound
This paper cites Poikela, J.
Reference 32
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 59b7be5c-9de8-4dc5-9cd5-596679d9ca69 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 33
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 3491a7f6-d6c8-4710-8512-f2ef01055ae2 · outbound
This paper cites High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
Reference 34
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 28fe5149-379b-4eb3-82ce-00e310808ddb · outbound
This paper cites Very-High Dynamic Range, 10,000 frames/second Pixel Array Detector for Electron Microscopy.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Very-High Dynamic Range, 10,000 frames/second Pixel Array Detector for Electron Microscopy
Reference 35
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 987b4e1e-93e8-45c1-a35c-5d2d43334007 · outbound
This paper cites Llopart, J.
Reference 36
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 5c3c1a06-d644-493a-bbe1-d8a1edd228e4 · outbound
This paper cites Zambon, S.
Reference 37
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 5e44c0a2-ce77-481d-bb25-11a2dde929d5 · outbound
This paper cites The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Reference 38
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 933bf18f-472a-4bd3-bf4e-1468e0c4a5cb · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 39
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation c69180ff-2e02-4e2f-977d-5a2242279ad3 · outbound
This paper cites Milazzo, G.
Reference 40
- Resolution
- verified exact
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation b354e0f3-031c-44d8-b350-12a1bc47b28f · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 41
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation feba6964-7ce5-4f7e-9a88-0e5fbd8417d5 · outbound
This paper cites Quantifying the Performance of a Hybrid Pixel Detector with GaAs:Cr Sensor for Transmission Electron Microscopy.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Quantifying the Performance of a Hybrid Pixel Detector with GaAs:Cr Sensor for Transmission Electron Microscopy
Reference 42
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 8616ad9c-41a8-47dd-aa9b-d809894cc580 · outbound
This paper cites M¨ uller, H.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials M¨ uller, H
Reference 43
- Resolution
- verified exact
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 5e5fa86f-a116-427e-b4bb-4ae9dc46108b · outbound
This paper cites M¨ uller-Caspary, F.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials M¨ uller-Caspary, F
Reference 44
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 99621bea-04ee-441e-8093-e4d7855712ad · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 45
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 2a1a96b6-db96-4878-b2e0-9ad04f9bb98b · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 46
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation fe87d2c5-67cc-4424-8c4c-b4e97c8c9a60 · outbound
This paper cites Frojdh, M.
Reference 47
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 227ee271-79a9-4147-9f07-5db4a80e1842 · outbound
This paper cites Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications
Reference 48
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.418728Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation a3283660-d887-40ca-8bbf-f7ededc5d80c · outbound
This paper cites Kuttruff, J.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Kuttruff, J
Reference 50
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 73711c3b-9066-4d82-ae7a-7b051d247e3f · outbound
This paper cites Hoppe, Beugung im inhomogenen Prim¨ arstrahlwellenfeld.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Hoppe, Beugung im inhomogenen Prim¨ arstrahlwellenfeld
Reference 51
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 877d7640-49d6-47d1-88a4-8d1292d4226c · outbound
This paper cites Hoppe, G.
Reference 52
- Resolution
- malformed identifier
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 5272a13b-2eeb-43cf-9ffb-30051a924e22 · outbound
This paper cites Hoppe, Beugung im inhomogenen Prim¨ arstrahlwellenfeld.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Hoppe, Beugung im inhomogenen Prim¨ arstrahlwellenfeld
Reference 53
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 6ce95ca6-1047-478b-afb7-f734c717c0d2 · outbound
This paper cites Drenth, A.
Reference 54
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 801dff8e-b7b4-4f43-8ed6-2ce577b48be4 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 55
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 711f7193-8412-432a-9e4f-884f896b1311 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 56
- Resolution
- verified exact
- doi, observed 2026-08-10T20:23:41.915305Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 5562e029-8a7a-4725-8574-54d4316a9ddf · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 57
- Resolution
- malformed identifier
- doi_truncated, observed 2026-08-10T20:23:41.820188Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation b6de646a-cc3e-41bf-a0ab-0fb3b24e7f07 · outbound
This paper cites Weierstall, Q.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Weierstall, Q
Reference 58
- Resolution
- verified exact
- doi, observed 2026-08-10T20:23:41.808239Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 07801d21-d935-4208-b1ee-ed5ff6c2d3b9 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 59
- Resolution
- verified exact
- doi, observed 2026-08-10T20:23:41.770840Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation bcc8f9cf-a39d-42c5-b9d8-3a4fa2efbb6f · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 60
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 80d27027-e4f1-42f1-8a06-7a3689f79e1f · outbound
This paper cites Low-dose cryo electron ptychography via non-convex Bayesian optimization.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Low-dose cryo electron ptychography via non-convex Bayesian optimization
Reference 61
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Observation b9d8bbfd-e62f-48f2-8336-45b18d9fc736 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 62
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Observation ed00812e-8c85-4018-9c42-575886f50226 · outbound
This paper cites K¨ u¸ c¨ uko˘ glu, I.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials K¨ u¸ c¨ uko˘ glu, I
Reference 63
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Observation 0a571a6d-da15-484d-b2ed-7589942d8f5f · outbound
This paper cites Multi-Convergence-Angle Ptychography with Simultaneous Strong Contrast and High Resolution.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Multi-Convergence-Angle Ptychography with Simultaneous Strong Contrast and High Resolution
Reference 64
- Resolution
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Observation 249fba18-3a94-408d-991b-ac2b1117edc3 · outbound
This paper cites Elser, Phase retrieval by iterated projections, Journal of the Optical Society of America A 20 (1) (2003) 40.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Elser, Phase retrieval by iterated projections, Journal of the Optical Society of America A 20 (1) (2003) 40
Reference 65
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Observation daf3eeb9-eb2d-4393-816c-9e72ce0dff3b · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 66
- Resolution
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Observation 208ba18e-1476-4f9a-abd2-78451a490975 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 67
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 22ab84ae-a0fc-49d0-a905-0b4bddf8b0eb · outbound
This paper cites Thibault, M.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Thibault, M
Reference 68
- Resolution
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Observation 6b812590-16e8-47a0-b562-0326c7f0e4c3 · outbound
This paper cites Thibault, M.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Thibault, M
Reference 69
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation a3cc8011-56fd-4bd6-8a4d-5f9e0d0b54a8 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 70
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Observation 08a63879-3626-4347-bd6b-dc1159e7fdcb · outbound
This paper cites Maiden, D.
Reference 71
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Observation 80824a34-3fe0-4d75-8903-3f344fa1206e · outbound
This paper cites Maiden, W.
Reference 72
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 94d1b93e-461f-4404-8026-00039d82889c · outbound
This paper cites Gerchberg, W.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Gerchberg, W
Reference 73
- Resolution
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Source-reported events for the cited work
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Observation 8c3c3fd0-7702-4658-b8a9-bd0c55f402ce · outbound
This paper cites Gerchberg, Super-resolution through Error Energy Reduction, Optica Acta: International Journal of Optics 21 (9) (1974) 709–720.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Gerchberg, Super-resolution through Error Energy Reduction, Optica Acta: International Journal of Optics 21 (9) (1974) 709–720
Reference 74
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 22d3b178-e0ed-4864-b85e-05c2fc53f7eb · outbound
This paper cites Guizar-Sicairos, J.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Guizar-Sicairos, J
Reference 75
- Resolution
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Source-reported events for the cited work
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Observation e441ffe8-bfac-42df-99f0-289238f4a28d · outbound
This paper cites Godard, M.
Reference 76
- Resolution
- unresolved
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Source-reported events for the cited work
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Observation 5fa1305e-eb96-4912-8f70-4356604f9101 · outbound
This paper cites Fourier ptychographic reconstruction using Poisson maximum likelihood and truncated Wirtinger gradient.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Fourier ptychographic reconstruction using Poisson maximum likelihood and truncated Wirtinger gradient
Reference 77
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation df6a8119-6c21-4eca-ab48-9c027aafe6cd · outbound
This paper cites Odstrˇ cil, A.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Odstrˇ cil, A
Reference 78
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.584608Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 92ce52fe-3194-4553-b0e2-d9ef7abef27b · outbound
This paper cites Thibault, M.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Thibault, M
Reference 79
- Resolution
- malformed identifier
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Observation 879b7801-238e-48d2-a932-615ddcf8b7e9 · outbound
This paper cites Generalized Proximal Smoothing for Phase Retrieval.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Generalized Proximal Smoothing for Phase Retrieval
Reference 80
- Resolution
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Unavailable: canonical work link unavailable.
Observation 9f7570e8-1615-4f82-bcca-c149cd39ce67 · outbound
This paper cites Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization
Reference 81
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation ba2f5342-dc59-4ab9-96cd-96611a539626 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 82
- Resolution
- verified exact
- doi, observed 2026-08-10T20:23:41.599727Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation f7581043-98be-4f74-91c0-715bf8349d30 · outbound
This paper cites Herdegen, B.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Herdegen, B
Reference 83
- Resolution
- verified exact
- doi, observed 2026-08-10T20:23:41.585258Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 9de17166-4c3d-4780-b9dd-5ee5f0856c25 · outbound
This paper cites Diederichs, Z.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Diederichs, Z
Reference 84
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation becc1a19-e948-413b-86b3-028868e6e88a · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 85
- Resolution
- verified exact
- doi, observed 2026-08-10T20:23:41.519427Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation 215cfeba-51d1-44e4-9771-472e2253aad4 · outbound
This paper cites Imaging thick objects with deep-sub-angstrom resolution and deep-sub-picometer precision.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Imaging thick objects with deep-sub-angstrom resolution and deep-sub-picometer precision
Reference 86
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 8ce0cec3-dc01-40cf-a5a9-cfdd20e3d524 · outbound
This paper cites Advanced Denoising for X-ray Ptychography.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Advanced Denoising for X-ray Ptychography
Reference 87
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.628808Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation f8232922-865f-42bc-8715-19767de138d7 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 88
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.633733Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 26e772fb-371f-460c-a6ae-e446a1d27d3f · outbound
This paper cites Maximum-likelihood estimation in ptychography in the presence of Poisson-Gaussian noise statistics.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Maximum-likelihood estimation in ptychography in the presence of Poisson-Gaussian noise statistics
Reference 89
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.638533Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 07449716-b62a-4f7f-b48f-2e278691ed0a · outbound
This paper cites Convergence properties of gradient methods for blind ptychography.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Convergence properties of gradient methods for blind ptychography
Reference 90
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 0ef5cabd-7c0b-419d-bd9d-59b243de3910 · outbound
This paper cites Katkovnik, J.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Katkovnik, J
Reference 91
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.648347Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 6ce7bd8a-b98c-41c5-8523-d2c1ac74499e · outbound
This paper cites SHARP: a distributed, GPU-based ptychographic solver.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials SHARP: a distributed, GPU-based ptychographic solver
Reference 92
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.652935Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 9649a194-c08d-478d-a3b8-51ab516c2f7b · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 93
- Resolution
- verified exact
- doi, observed 2026-08-10T20:23:41.473905Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.
Observation be34bba9-1986-432b-8f1b-db56268f4f6b · outbound
This paper cites Image Gradient Decomposition for Parallel and Memory-Efficient Ptychographic Reconstruction.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Image Gradient Decomposition for Parallel and Memory-Efficient Ptychographic Reconstruction
Reference 94
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.663050Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation b2f6518d-78f9-4fc3-b491-2ace6b491b6e · outbound
This paper cites A roadmap for edge computing enabled automated multidimensional transmission electron microscopy.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials A roadmap for edge computing enabled automated multidimensional transmission electron microscopy
Reference 95
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.667905Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation a9163b9f-2ecb-461f-903f-b3e6d9f17708 · outbound
This paper cites Streaming Large-Scale Electron Microscopy Data to a Supercomputing Facility.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Streaming Large-Scale Electron Microscopy Data to a Supercomputing Facility
Reference 96
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.672876Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation e5a971a3-7576-4d69-b308-8d4181caf181 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 98
- Resolution
- malformed identifier
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation c5c47375-b8fa-46a4-9ab5-bac6c25695a7 · outbound
This paper cites Live processing of momentum-resolved STEM data for first moment imaging and ptychography.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Live processing of momentum-resolved STEM data for first moment imaging and ptychography
Reference 100
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.691706Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 29574a69-ed3e-4fbd-85ac-1264b7fbe0d2 · outbound
This paper cites Wigner Distribution Deconvolution Adaptation for Live Ptychography Reconstruction.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Wigner Distribution Deconvolution Adaptation for Live Ptychography Reconstruction
Reference 101
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.698038Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 9eedab82-9feb-4338-ba99-917573037663 · outbound
This paper cites Live Iterative Ptychography.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Live Iterative Ptychography
Reference 102
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.703271Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 96082735-1a55-4141-858a-ebeecd094cab · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 103
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.708197Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 83ab776c-4115-4c36-9dda-ef5eb5501cb0 · outbound
This paper cites an unresolved cited work.
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials Unresolved cited work
Reference 104
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T20:21:09.713485Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Pith citing papers
Observation a69309eb-7c81-4def-97ff-04ffb11a8856 · inbound
Guided progressive reconstructive imaging: a new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography cites this paper.
Guided progressive reconstructive imaging: a new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
Reference 40
- Resolution
- unresolved
- no resolver link, observed 2026-08-03T15:20:32.382873Z
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Unavailable: canonical work link unavailable.