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Depth-resolved measurements of the Meissner screening profile in surface-treated Nb

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arxiv 2212.11081 v1 pith:AKG5RGK5 submitted 2022-12-21 cond-mat.supr-con cond-mat.mtrl-sci

Depth-resolved measurements of the Meissner screening profile in surface-treated Nb

classification cond-mat.supr-con cond-mat.mtrl-sci
keywords screeningsurfacemeissnerdepth-resolvedfieldmeasurementsprofileprofiles
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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We report depth-resolved measurements of the Meissner screening profile in several surface-treated Nb samples using low-energy muon spin rotation (LE-$\mu$SR). In these experiments, implanted positive muons, whose stopping depths below Nb's surface were adjusted between ~10 nm to ~150 nm, reveal the field distribution inside the superconducting element via their spin-precession (communicated through their radioactive decay products). We compare how the field screening is modified by different surface treatments commonly employed to prepare superconducting radio frequency (SRF) cavities used in accelerator beamlines. In contrast to an earlier report [A. Romanenko et al., Appl. Phys. Lett. 104 072601 (2014)], we find no evidence for any "anomalous" modifications to the Meissner profiles, with all data being well-described by a London model. Differences in screening properties between surface treatments can be explained by changes to the carrier mean-free-paths resulting from dopant profiles near the material's surface.

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