Pith. sign in

REVIEW

Faster and Better Quantum Software Testing through Specification Reduction and Projective Measurements

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2405.15450 v2 pith:BY5QKYOO submitted 2024-05-24 cs.SE quant-ph

Faster and Better Quantum Software Testing through Specification Reduction and Projective Measurements

classification cs.SE quant-ph
keywords quantumapproachprogramsfaultslimitationsreductionspecificationdistributions
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
read the original abstract

Quantum computing promises polynomial and exponential speedups in many domains, such as unstructured search and prime number factoring. However, quantum programs yield probabilistic outputs from exponentially growing distributions and are vulnerable to quantum-specific faults. Existing quantum software testing (QST) approaches treat quantum superpositions as classical distributions. This leads to two major limitations when applied to quantum programs: (1) an exponentially growing sample space distribution and (2) failing to detect quantum-specific faults such as phase flips. To overcome these limitations, we introduce a QST approach, which applies a reduction algorithm to a quantum program specification. The reduced specification alleviates the limitations (1) by enabling faster sampling through quantum parallelism and (2) by performing projective measurements in the mixed Hadamard basis. Our evaluation of 143 quantum programs across four categories demonstrates significant improvements in test runtimes and fault detection with our reduction approach. Average test runtimes improved from 169.9s to 11.8s, with notable enhancements in programs with large circuit depths (383.1s to 33.4s) and large program specifications (464.8s to 7.7s). Furthermore, our approach increases mutation scores from 54.5% to 74.7%, effectively detecting phase flip faults that non-reduced specifications miss. These results underline our approach's importance to improve QST efficiency and effectiveness.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.