Dielectric Properties of Conductively Loaded Polyimides in the Far Infrared

The dielectric properties of selected conductively-loaded polyimide samples are characterized in microwave through far infrared wavebands. These materials, belonging to the Vespel\textsuperscript{\textregistered} family, are more readily formed by direct machining than their ceramic loaded epoxy counterparts and present an interesting solution for realizing absorptive optical control structures. Measurements spanning a spectral range from 1 to 600\,${\rm cm^{-1}}$ (0.03 to 18\,THz) were preformed and used in parametrization of the media's dielectric function at frequencies below $\approx3\,$THz.