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Nanoscale Optical Imaging of 2D Semiconductor Stacking Orders by Exciton-Enhanced Second Harmonic Generation

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arxiv 2111.06955 v1 pith:GCDPJRVW submitted 2021-11-12 physics.optics cond-mat.mes-hallcond-mat.mtrl-sciphysics.app-ph

Nanoscale Optical Imaging of 2D Semiconductor Stacking Orders by Exciton-Enhanced Second Harmonic Generation

classification physics.optics cond-mat.mes-hallcond-mat.mtrl-sciphysics.app-ph
keywords symmetrynonlinearopticalcrystalemerginggenerationharmonicimaging
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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Second harmonic generation (SHG) is a nonlinear optical response arising exclusively from broken inversion symmetry in the electric-dipole limit. Recently, SHG has attracted widespread interest as a versatile and noninvasive tool for characterization of crystal symmetry and emerging ferroic or topological orders in quantum materials. However, conventional far-field optics is unable to probe local symmetry at the deep subwavelength scale. Here, we demonstrate near-field SHG imaging of 2D semiconductors and heterostructures with the spatial resolution down to 20 nm using a scattering-type nano-optical apparatus. We show that near-field SHG efficiency is greatly enhanced by excitons in atomically thin transition metal dichalcogenides. Furthermore, by correlating nonlinear and linear scattering-type nano-imaging, we resolve nanoscale variations of interlayer stacking order in bilayer WSe2, and reveal the stacking-tuned excitonic light-matter-interactions. Our work demonstrates nonlinear optical interrogation of crystal symmetry and structure-property relationships at the nanometer length scales relevant to emerging properties in quantum materials.

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