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Modeling the underlying mechanisms for organic memory devices: Tunneling, electron emission and oxygen adsorbing

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arxiv 1204.2022 v1 pith:JX2RTD4W submitted 2012-04-10 cond-mat.mes-hall cond-mat.mtrl-sci

Modeling the underlying mechanisms for organic memory devices: Tunneling, electron emission and oxygen adsorbing

classification cond-mat.mes-hall cond-mat.mtrl-sci
keywords memorydevicestheoreticaleffectexperimentalorganicoxygentunneling
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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We present a combined experimental and theoretical study to get insight into both memory and negative differential resistance (NDR) effect in organic memory devices. The theoretical model we propose is simply a one-dimensional metallic island array embedding within two electrodes. We use scattering operator method to evaluate the tunneling current among the electrode and islands to establish the basic bistable I-V curves for several devices. The theoretical results match the experiments very well, and both memory and NDR effect could be understood comprehensively. The experimental correspondence, say, the experiment of changing the pressure of oxygen, is addressed as well.

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