Pith. sign in

REVIEW

Red Emission from Strain-Relaxed Bulk InGaN Active Region

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2503.04947 v1 pith:OGXVN3NM submitted 2025-03-06 cond-mat.mtrl-sci cond-mat.mes-hall

Red Emission from Strain-Relaxed Bulk InGaN Active Region

classification cond-mat.mtrl-sci cond-mat.mes-hall
keywords inganbulkledsactiveemissiongrowthhigh-in-contentpeak
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
0 comments
Share X Bluesky LinkedIn Reddit HN
read the original abstract

High-In-content InGaN quantum wells (QWs) in red light-emitting diodes (LEDs) are typically grown at low temperatures to ensure effective In incorporation. In this study, red LEDs based on bulk InGaN active region were demonstrated. The growth temperature of bulk InGaN was ~800C, which is over 100C higher than the typical growth temperature of red QWs. By introducing high-density trench structures in the underlying green multi-quantum wells (MQWs), the compressive strain in bulk InGaN was relaxed by ~96%. With strain relaxation, phase separation occurred in the bulk InGaN, forming low-In-content (blue) and high-In-content (red) phases. The red phase acted as carrier localization centers, enabling red light emission under electrical injection. The red LEDs based on bulk InGaN exhibited a peak wavelength of 645 nm at 20 mA, with on-wafer peak external quantum efficiency of 0.32%. This study presents a new epitaxial strategy for red InGaN LEDs.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.