Paper Citation Record · LEDGER

Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation

As of 7 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 6 inbound Pith citation observations for arXiv:2408.13509.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2408.13509 v3

Coverage vector

measured 0 of 0 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links

measured 6 of 6 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-07T06:34:17.273281+00:00

measured 6 of 6 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-06T17:57:50.427226Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: arxiv_reference, observed 2026-05-19T05:57:08.179005Z

Reference resolution

0 of 0 outbound references displayed

verified exact0
verified fuzzy0
unresolved0
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

No outbound reference observations are available for this paper version.

Pith citing papers

Observation b6666356-f4e8-4b3d-8e6c-dde54bc6655d · inbound

MAGIC: Few-Shot Mask-Guided Anomaly Inpainting with Prompt Perturbation, Spatially Adaptive Guidance, and Context Awareness cites this paper.

MAGIC: Few-Shot Mask-Guided Anomaly Inpainting with Prompt Perturbation, Spatially Adaptive Guidance, and Context Awareness Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation

Reference 11

Resolution: verified exact; arxiv_id, observed 2026-05-19T05:57:08.182170Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation f9797ff2-8137-4ec5-87a1-9c7332e20cd0 · inbound

Generate Aligned Anomaly: Region-Guided Few-Shot Anomaly Image-Mask Pair Synthesis for Industrial Inspection cites this paper.

Generate Aligned Anomaly: Region-Guided Few-Shot Anomaly Image-Mask Pair Synthesis for Industrial Inspection Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation

Reference 21

Resolution: unresolved; no resolver link, observed 2026-08-06T17:57:50.427226Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 08319a66-50a8-4b64-a77c-e3884f67dda0 · inbound

A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects cites this paper.

A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation

Reference 72

Resolution: unresolved; no resolver link, observed 2026-08-06T17:21:42.812334Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation d623f2d6-3023-4378-96c5-6a35f4e52603 · inbound

STAGE: Segmentation-oriented Industrial Anomaly Synthesis via Graded Diffusion with Explicit Mask Alignment cites this paper.

STAGE: Segmentation-oriented Industrial Anomaly Synthesis via Graded Diffusion with Explicit Mask Alignment Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation

Reference 11

Resolution: unresolved; no resolver link, observed 2026-08-04T23:20:40.369817Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 94d599b3-4d81-406c-83a1-5a52b45a8e37 · inbound

HLGFA: High-Low Resolution Guided Feature Alignment for Unsupervised Anomaly Detection cites this paper.

HLGFA: High-Low Resolution Guided Feature Alignment for Unsupervised Anomaly Detection Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation

Reference 9

Resolution: verified exact; arxiv_id, observed 2026-05-16T03:07:11.931748Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Observation 80f6eeb3-a027-47bb-989c-af761d27bb65 · inbound

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing cites this paper.

ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation

Reference 3

Resolution: unresolved; no resolver link, observed 2026-07-11T15:22:48.211209Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.