Pith. sign in

REVIEW 1 cited by

PaSTe: Improving the Efficiency of Visual Anomaly Detection at the Edge

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2410.11591 v1 pith:QZ4X6JPC submitted 2024-10-15 cs.CV cs.AIcs.LG

classification cs.CVcs.AIcs.LG
keywords edgeanomalydeploymentdevicespastedetectionreal-worldtime
verification ladder T0 review T1 audit T2 compute T3 formal

Signed reviews

No signed human review yet.

0 comments
read the original abstract

Visual Anomaly Detection (VAD) has gained significant research attention for its ability to identify anomalous images and pinpoint the specific areas responsible for the anomaly. A key advantage of VAD is its unsupervised nature, which eliminates the need for costly and time-consuming labeled data collection. However, despite its potential for real-world applications, the literature has given limited focus to resource-efficient VAD, particularly for deployment on edge devices. This work addresses this gap by leveraging lightweight neural networks to reduce memory and computation requirements, enabling VAD deployment on resource-constrained edge devices. We benchmark the major VAD algorithms within this framework and demonstrate the feasibility of edge-based VAD using the well-known MVTec dataset. Furthermore, we introduce a novel algorithm, Partially Shared Teacher-student (PaSTe), designed to address the high resource demands of the existing Student Teacher Feature Pyramid Matching (STFPM) approach. Our results show that PaSTe decreases the inference time by 25%, while reducing the training time by 33% and peak RAM usage during training by 76%. These improvements make the VAD process significantly more efficient, laying a solid foundation for real-world deployment on edge devices.

Discussion (0). Continue with ORCID to comment.

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study

    cs.CV 2025-05 conditional novelty 6.0 of 10

    On the MIIC semiconductor SEM dataset, feature-based visual anomaly detection methods such as CFA and STFPM achieve strong image-level and pixel-level defect detection, but a reconstruction-based method from 2021 stil...

Pith tools