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Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements
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Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements
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We present time-resolved X-ray diffraction measurements using advanced timing schemes that provide high temporal resolution while also maintaining a high flux in the X-ray probe beam. The method employs patterned probe pulse sequences that are generated with the WaveGate solid-state pulse picker. We demonstrate the feasibility of our method at two different beamlines on millisecond and microsecond timescales.
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