BaCd2P2: a promising impurity-tolerant counterpart of GaAs for photovoltaics
Pith reviewed 2026-05-19 07:20 UTC · model grok-4.3
The pith
BaCd2P2 achieves GaAs-comparable carrier lifetimes and voltages despite low-purity precursors because its intrinsic defects and most transition-metal impurities induce less nonradiative recombination.
A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.
Core claim
BaCd2P2 exhibits lower nonradiative recombination rates from its dominant deep-level intrinsic antisite defects than GaAs does under typical growth conditions, while most transition metal impurities from raw materials or synthesis do not form deep-level nonradiative recombination centers, enabling high performance with low-purity precursors.
What carries the argument
First-principles defect modeling that calculates formation energies, charge transition levels, and nonradiative recombination rates for intrinsic antisites and extrinsic transition-metal impurities in both BaCd2P2 and GaAs.
If this is right
- Polycrystalline BaCd2P2 can reach performance metrics comparable to high-purity GaAs without requiring expensive precursor purification.
- The cost-to-performance ratio of thin-film photovoltaics improves if BaCd2P2 replaces GaAs in impurity-sensitive device architectures.
- Most common transition metals can be tolerated in the growth environment of BaCd2P2 without creating additional recombination losses.
- Lower nonradiative rates from antisites allow BaCd2P2 to operate closer to its radiative limit under standard processing temperatures.
Where Pith is reading between the lines
- If the defect tolerance extends to device stacks, BaCd2P2 could relax purity specifications across the entire supply chain for compound semiconductor solar cells.
- Similar pnictide compounds with the same crystal motif may share the same impurity tolerance, suggesting a broader search space for low-cost absorbers.
- Grain-boundary passivation strategies developed for other polycrystalline absorbers could be tested on BaCd2P2 to isolate whether the reported lifetimes already include boundary losses.
Load-bearing premise
The measured carrier lifetimes and photoluminescence yields in polycrystalline or powder samples directly reflect bulk defect-limited performance without major contributions from grain boundaries, surfaces, or synthesis-specific contaminants.
What would settle it
A direct measurement showing that single-crystal or higher-purity BaCd2P2 samples exhibit substantially shorter carrier lifetimes than the defect-model predictions, or experimental detection of a deep-level transition-metal impurity not captured by the calculations.
Figures
read the original abstract
BaCd2P2 (BCP) has been recently identified as a new solar absorber with promising optoelectronic properties. This work demonstrates that, despite having a low precursor purity (98.90% to 99.95%), synthesized BCP samples exhibit a promising photoconductive carrier lifetime up to 300 ns, an implied open-circuit voltage exceeding 1 V, and photoluminescence quantum yield in the order of 0.2%, comparable to a high-purity single-crystalline GaAs wafer. To better understand the underlying mechanisms of BCP's promising properties, its tolerance to intrinsic defects and extrinsic impurities is investigated using first-principles defect modeling and compared with that of the well-studied GaAs. The results show that the nonradiative recombination rates induced by dominant deep-level intrinsic antisite defects are lower in BCP than in GaAs under typical growth conditions. Further exploration of the impact of transition metal impurities in the raw materials used to make BCP and impurities introduced during its synthesis shows that most of these do not form deep-level nonradiative recombination centers. As an impurity-tolerant counterpart of GaAs, BCP demonstrates great potential to improve the cost-to-performance ratio of photovoltaics.
Editorial analysis
A structured set of objections, weighed in public.
Referee Report
Summary. The manuscript reports synthesis of BaCd2P2 (BCP) from low-purity precursors (98.90–99.95%) yielding polycrystalline samples with photoconductive carrier lifetimes up to 300 ns, implied open-circuit voltage exceeding 1 V, and PLQY on the order of 0.2%, values stated to be comparable to a high-purity single-crystalline GaAs wafer. First-principles defect calculations are used to argue that nonradiative recombination rates from dominant deep-level intrinsic antisite defects are lower in BCP than in GaAs under typical growth conditions, and that most transition-metal impurities from the precursors do not form deep-level nonradiative centers, positioning BCP as an impurity-tolerant GaAs counterpart for photovoltaics.
Significance. If the central claims hold, the work would be significant for low-cost photovoltaics by demonstrating that a new absorber can achieve GaAs-like performance metrics despite low precursor purity. The combination of direct experimental lifetime/PLQY data on low-purity material with first-principles defect modeling provides a useful template for assessing impurity tolerance. The paper's strength lies in the explicit rate comparison to GaAs and the broad survey of transition-metal impurities; these elements are load-bearing for the impurity-tolerance narrative.
major comments (2)
- [Defect modeling section] Defect modeling section: the formation energies (and therefore the identity of dominant antisite defects and the recombination-rate comparison to GaAs) are computed under a specific set of chemical-potential bounds labeled 'typical growth conditions,' yet no explicit mapping is provided from the actual precursor purities (98.9–99.95%) or synthesis route onto those bounds. If the experimental conditions lie near a different phase-diagram boundary, the dominant defect and the rate ordering can invert, directly affecting the central claim.
- [Experimental results and discussion] Experimental results and discussion: the reported carrier lifetimes (up to 300 ns) and PLQY (~0.2%) are presented for polycrystalline/powder samples without error bars, replicate statistics, or controls that separate bulk defect-limited recombination from grain-boundary or surface-state contributions. Because the impurity-tolerance conclusion rests on these values reflecting intrinsic bulk performance, the absence of such controls is load-bearing for the comparison to GaAs.
minor comments (2)
- [Abstract] Abstract: the phrase 'photoluminescence quantum yield in the order of 0.2%' should specify the excitation conditions, sample geometry, and direct numerical comparison to the GaAs reference wafer.
- [Throughout] Notation and figures: ensure all quantities in tables and figures carry explicit units and that the abbreviation BCP is defined at first use in the main text.
Simulated Author's Rebuttal
We thank the referee for their insightful comments on our manuscript. We provide point-by-point responses to the major comments below, indicating where revisions have been made to address the concerns.
read point-by-point responses
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Referee: [Defect modeling section] Defect modeling section: the formation energies (and therefore the identity of dominant antisite defects and the recombination-rate comparison to GaAs) are computed under a specific set of chemical-potential bounds labeled 'typical growth conditions,' yet no explicit mapping is provided from the actual precursor purities (98.9–99.95%) or synthesis route onto those bounds. If the experimental conditions lie near a different phase-diagram boundary, the dominant defect and the rate ordering can invert, directly affecting the central claim.
Authors: We thank the referee for this important point. The chemical potential bounds for 'typical growth conditions' were selected based on the synthesis conditions using low-purity elemental precursors as detailed in the methods. To make this mapping explicit, we have added text in the revised defect modeling section that relates the precursor purities to the chemical potential limits. This includes a brief analysis showing that the dominant antisite defects remain the same within the range of purities used, preserving the recombination rate comparison to GaAs. revision: yes
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Referee: [Experimental results and discussion] Experimental results and discussion: the reported carrier lifetimes (up to 300 ns) and PLQY (~0.2%) are presented for polycrystalline/powder samples without error bars, replicate statistics, or controls that separate bulk defect-limited recombination from grain-boundary or surface-state contributions. Because the impurity-tolerance conclusion rests on these values reflecting intrinsic bulk performance, the absence of such controls is load-bearing for the comparison to GaAs.
Authors: We agree that the experimental data presentation can be improved. We have revised the manuscript to include error bars on the lifetime and PLQY values, derived from replicate measurements on several batches, and added a supplementary table with the statistics. For the separation of bulk versus grain-boundary contributions, we note that in polycrystalline samples this is inherently difficult without additional techniques. We have included a new discussion paragraph highlighting this as a limitation of the current powder-based study and emphasizing that the measured values still indicate good performance for low-purity material. A full isolation of bulk properties would require single-crystal samples, which we plan for future studies. revision: partial
- Full experimental controls to distinguish bulk defect recombination from grain boundary effects would require single-crystal growth and advanced characterization not performed in this study.
Circularity Check
No significant circularity; derivation relies on independent first-principles modeling
full rationale
The paper's core claims rest on first-principles defect formation energies and recombination rate calculations for BCP and GaAs. These are presented as separate computational results benchmarked against established GaAs literature, not fitted or derived from the experimental carrier lifetimes, PLQY, or synthesis data in this work. No equations reduce a prediction to a fitted input by construction, no self-citation is invoked as a uniqueness theorem or load-bearing premise, and no ansatz or renaming creates a definitional loop. The chemical potential assumptions are external inputs to the model rather than outputs of the present derivation.
Axiom & Free-Parameter Ledger
axioms (1)
- domain assumption Standard supercell DFT with typical exchange-correlation functional and finite-size corrections accurately predict defect formation energies and transition levels in these compounds.
Lean theorems connected to this paper
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IndisputableMonolith/Cost/FunctionalEquation.leanwashburn_uniqueness_aczel unclear?
unclearRelation between the paper passage and the cited Recognition theorem.
We use density functional theory (DFT) with the hybrid functional of Heyd-Scuseria-Ernzerhof (HSE) to calculate the SRH rate in BCP and GaAs... The defect concentration depends on elemental chemical potentials... SRH nonradiative recombination rate ranging from 2.13×10^14 to 1.90×10^19 cm^{-3} s^{-1}
What do these tags mean?
- matches
- The paper's claim is directly supported by a theorem in the formal canon.
- supports
- The theorem supports part of the paper's argument, but the paper may add assumptions or extra steps.
- extends
- The paper goes beyond the formal theorem; the theorem is a base layer rather than the whole result.
- uses
- The paper appears to rely on the theorem as machinery.
- contradicts
- The paper's claim conflicts with a theorem or certificate in the canon.
- unclear
- Pith found a possible connection, but the passage is too broad, indirect, or ambiguous to say the theorem truly supports the claim.
Forward citations
Cited by 1 Pith paper
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Thin film synthesis of SrZn2P2 with SrI2 post-annealing for enhanced crystallinity and optoelectronic quality
SrI2 post-annealing of sputtered SrZn2P2 thin films causes grain growth, reduces diffraction peak broadening, preserves phase purity, and boosts photoluminescence intensity and uniformity near the 1.8 eV direct bandgap.
Reference graph
Works this paper leans on
-
[1]
Discovery of the Zintl-phosphide BaCd2P2 as a long carrier lifetime and stable solar absorber
Zhenkun Yuan et al. “Discovery of the Zintl-phosphide BaCd2P2 as a long carrier lifetime and stable solar absorber”. In: Joule 8.5 (May 2024), pp. 1412–
work page 2024
-
[2]
doi: 10.1016/j.joule.2024.02.017
issn: 25424351. doi: 10.1016/j.joule.2024.02.017
-
[3]
Low-Temperature Synthesis of Stable CaZn2P2 Zintl Phosphide Thin Films as Candidate Top Absorbers
Shaham Quadir et al. “Low-Temperature Synthesis of Stable CaZn2P2 Zintl Phosphide Thin Films as Candidate Top Absorbers”. In: Advanced Energy Ma- terials (Sept. 2024). issn: 1614-6832. doi: 10.1002/aenm.202402640
-
[4]
Synthesis and Characterization of Zintl-Phase BaCd2P2 Quantum Dots for Optoelectronic Applications
Matthew P. Hautzinger et al. “Synthesis and Characterization of Zintl-Phase BaCd2P2 Quantum Dots for Optoelectronic Applications”. In:ACS Nano 19.12 (Apr. 2025), pp. 12345–12353. issn: 1936-0851. doi: 10 . 1021 / acsnano . 5c02271
work page 2025
-
[5]
Zintl Phases: From Curiosities to Impactful Materials
Susan M. Kauzlarich. “Zintl Phases: From Curiosities to Impactful Materials”. In: Chemistry of Materials 35.18 (Sept. 2023), pp. 7355–7362. issn: 0897-4756. doi: 10.1021/acs.chemmater.3c01874
-
[6]
A Map of the Zintl AM2Pn2 Compounds: Influence of Chemistry on Stability and Electronic Structure
Andrew Pike et al. “A Map of the Zintl AM2Pn2 Compounds: Influence of Chemistry on Stability and Electronic Structure”. In: arXiv (Feb. 2025). doi: 10.48550/arXiv.2502.08801
-
[7]
Omar Zayed et al. “Study of electronics, optoelectronic and thermoelectric as- pects of novel Zintl-phase alloys CaCd2X2 (X = P, As, Sb) for solar cells and renewable energy”. In: Solid State Communications 403 (Sept. 2025), p. 116020. issn: 00381098. doi: 10.1016/j.ssc.2025.116020
-
[8]
Semiconducting and other major properties of gallium ar- senide
J. S. Blakemore. “Semiconducting and other major properties of gallium ar- senide”. In: Journal of Applied Physics 53.10 (Oct. 1982), R123–R181. issn: 0021-8979. doi: 10.1063/1.331665
-
[9]
Accelerating research on novel photovoltaic materials
Thomas Unold. “Accelerating research on novel photovoltaic materials”. In: Faraday Discussions 239 (2022), pp. 235–249. issn: 1359-6640. doi: 10.1039/ D2FD00085G
work page 2022
-
[10]
Pietro Caprioglio et al. “On the Relation between the Open-Circuit Voltage and Quasi-Fermi Level Splitting in Efficient Perovskite Solar Cells”. In: Advanced Energy Materials 9.33 (Sept. 2019). issn: 1614-6832. doi: 10 . 1002 / aenm . 201901631
work page 2019
-
[11]
Lifetime, quasi-Fermi level splitting and doping con- centration of Cu-rich CuInS2 absorbers
Damilola Adeleye et al. “Lifetime, quasi-Fermi level splitting and doping con- centration of Cu-rich CuInS2 absorbers”. In: Materials Research Express 8.2 (Feb. 2021), p. 025905. issn: 2053-1591. doi: 10.1088/2053-1591/abe3c1
-
[12]
Reduction of GaAs surface recombination velocity by chem- ical treatment
R. J. Nelson et al. “Reduction of GaAs surface recombination velocity by chem- ical treatment”. In: Applied Physics Letters 36.1 (Jan. 1980), pp. 76–79. issn: 0003-6951. doi: 10.1063/1.91280. 29
-
[13]
Claus Klingshirn. Semiconductor optics . 2007. doi: 10 . 1007 / 978 - 3 - 540 - 38347-5
work page 2007
-
[14]
Comprehensive semiconductor science and technology
Pallab Bhattacharya, Roberto Fornari, and Hiroshi Kamimura. Comprehensive semiconductor science and technology . Vol. 1-6. 2011. doi: 10.1016/c2009-1- 28364-x
-
[15]
Y.P. Varshni. “Temperature dependence of the energy gap in semiconductors”. In: Physica 34.1 (Jan. 1967), pp. 149–154. issn: 00318914. doi: 10.1016/0031- 8914(67)90062-6
-
[16]
E. Fred Schubert, Jaehee Cho, and Jong Kyu Kim. “Light Emitting Diodes”. In: Reference Module in Materials Science and Materials Engineering . Elsevier,
-
[17]
doi: 10.1016/B978-0-12-803581-8.01081-X
-
[18]
Handbook Series on Semiconductor Parameters
M Levinshtein, S Rumyantsev, and M Shur. Handbook Series on Semiconductor Parameters. Vol. 1. WORLD SCIENTIFIC, Nov. 1996. isbn: 978-981-02-2934-
work page 1996
-
[19]
doi: 10.1142/2046-vol1
-
[20]
The Physics of Solar Cells, by Jenny Nelson
Tony Leggett. “The Physics of Solar Cells, by Jenny Nelson”. In: Contemporary Physics 53.5 (2012). issn: 0010-7514. doi: 10.1080/00107514.2012.727031
-
[21]
Photoluminescence assessment of materials for solar cell absorbers
Susanne Siebentritt et al. “Photoluminescence assessment of materials for solar cell absorbers”. In: Faraday Discussions 239 (2022), pp. 112–129. issn: 1359-
work page 2022
-
[22]
doi: 10.1039/D2FD00057A
-
[23]
How photoluminescence can predict the efficiency of solar cells
Susanne Siebentritt et al. “How photoluminescence can predict the efficiency of solar cells”. In: Journal of Physics: Materials 4.4 (Oct. 2021), p. 042010. issn: 2515-7639. doi: 10.1088/2515-7639/ac266e
-
[24]
The chemical potential of radiation
P Wurfel. “The chemical potential of radiation”. In: Journal of Physics C: Solid State Physics 15.18 (June 1982), pp. 3967–3985. issn: 0022-3719. doi: 10.1088/0022-3719/15/18/012
-
[25]
Spontaneous and Stimulated Recombination Radiation in Semiconductors
Gordon Lasher and Frank Stern. “Spontaneous and Stimulated Recombination Radiation in Semiconductors”. In: Physical Review 133.2A (Jan. 1964), A553– A563. issn: 0031-899X. doi: 10.1103/PhysRev.133.A553
-
[26]
Quasi-Fermi level splitting and sub- bandgap absorptivity from semiconductor photoluminescence
John K. Katahara and Hugh W. Hillhouse. “Quasi-Fermi level splitting and sub- bandgap absorptivity from semiconductor photoluminescence”. In: Journal of Applied Physics 116.17 (Nov. 2014). issn: 0021-8979. doi: 10.1063/1.4898346
-
[27]
Direct-bandgap emission from hexagonal Ge and SiGe alloys
Elham M.T. Fadaly et al. “Direct-bandgap emission from hexagonal Ge and SiGe alloys”. In: Nature 580.7802 (2020). issn: 14764687. doi: 10 . 1038 / s41586-020-2150-y
work page 2020
-
[28]
Photoluminescence Analysis of Thin-Film Solar Cells
Thomas Unold and Levent G¨ utay. “Photoluminescence Analysis of Thin-Film Solar Cells”. In: Advanced Characterization Techniques for Thin Film Solar Cells. Wiley, Sept. 2016, pp. 275–297. doi: 10.1002/9783527699025.ch11. 30
-
[29]
Photon-Radiative Recombination of Electrons and Holes in Germanium
W. van Roosbroeck and W. Shockley. “Photon-Radiative Recombination of Electrons and Holes in Germanium”. In: Physical Review 94.6 (June 1954), pp. 1558–1560. issn: 0031-899X. doi: 10.1103/PhysRev.94.1558
-
[30]
S.M. Sze and Kwok K. Ng. Physics of Semiconductor Devices . 2006. doi: 10. 1002/0470068329
work page 2006
-
[31]
P. A. Folkes, B. Connelly, and F. Towner. Minority Carrier Lifetime and Inter- facial Recombination Velocity in GaAs/AlGaAs Double Heterostructures . Tech. rep. U.S. Army Research Laboratory, Sept. 2012
work page 2012
-
[32]
G. B. Lush et al. “A study of minority carrier lifetime versus doping concen- tration in n-type GaAs grown by metalorganic chemical vapor deposition”. In: Journal of Applied Physics 72.4 (Aug. 1992), pp. 1436–1442. issn: 0021-8979. doi: 10.1063/1.351704
-
[33]
Hole diffusion length investigation by photon and electron excitation of GaAs Schottky barriers
Luciano Tarricone et al. “Hole diffusion length investigation by photon and electron excitation of GaAs Schottky barriers”. In: Journal of Applied Physics 60.5 (Sept. 1986), pp. 1745–1752. issn: 0021-8979. doi: 10.1063/1.337269
-
[34]
Doping Dependence of Hole Lifetime in n-Type GaAs
C. J. Hwang. “Doping Dependence of Hole Lifetime in n-Type GaAs”. In: Jour- nal of Applied Physics 42.11 (Oct. 1971), pp. 4408–4413. issn: 0021-8979. doi: 10.1063/1.1659787
-
[35]
M.A. Green. “Limits on the open-circuit voltage and efficiency of silicon solar cells imposed by intrinsic Auger processes”. In: IEEE Transactions on Electron Devices 31.5 (May 1984), pp. 671–678. issn: 0018-9383. doi: 10 . 1109 / T - ED.1984.21588
-
[36]
Bridging theory and experiment in defect-tolerant semiconductors for photovoltaics
Maria S. Hammer et al. “Bridging theory and experiment in defect-tolerant semiconductors for photovoltaics”. In: Nature Reviews Materials 10.4 (Feb. 2025), pp. 311–325. issn: 2058-8437. doi: 10.1038/s41578-024-00769-9
-
[37]
Matthew D. McCluskey and Eugene E. Haller. Dopants and defects in semicon- ductors. 2012. doi: 10.1201/b11819
-
[38]
Nonradiative Recombination in Semiconductors
Abakumov V.N., Perel V.I., and Yassievich I.N. Nonradiative Recombination in Semiconductors. Ed. by Abakumov V.N. and Perel V.I. 1st ed. Vol. 33. Elsevier Science, 1991
work page 1991
-
[39]
U.K. Mishra, P. Parikh, and Yi-Feng Wu. “AlGaN/GaN HEMTs-an overview of device operation and applications”. In: Proceedings of the IEEE 90.6 (June 2002), pp. 1022–1031. issn: 0018-9219. doi: 10.1109/JPROC.2002.1021567
-
[40]
Fully Ab Initio Finite-Size Corrections for Charged-Defect Supercell Calculations
Christoph Freysoldt, J¨ org Neugebauer, and Chris G. Van de Walle. “Fully Ab Initio Finite-Size Corrections for Charged-Defect Supercell Calculations”. In: Physical Review Letters 102.1 (Jan. 2009), p. 016402. issn: 0031-9007. doi: 10.1103/PhysRevLett.102.016402. 31
-
[41]
Christoph Freysoldt et al. “First-principles calculations for point defects in solids”. In: Reviews of Modern Physics 86.1 (Mar. 2014), pp. 253–305. issn: 0034-6861. doi: 10.1103/RevModPhys.86.253
-
[42]
Darius Kuciauskas et al. “Why Increased CdSeTe Charge Carrier Lifetimes and Radiative Efficiencies did not Result in Voltage Boost for CdTe Solar Cells”. In: Advanced Energy Materials 13.35 (Sept. 2023). issn: 1614-6832. doi: 10. 1002/aenm.202301784
work page 2023
-
[43]
Patrik ˇSˇ cajev et al. “As-Doped Polycrystalline CdSeTe: Localized Defects, Car- rier Mobility and Lifetimes, and Impact on High-Efficiency Solar Cells”. In: Advanced Energy Materials 15.10 (Mar. 2025). issn: 1614-6832. doi: 10.1002/ aenm.202403902
work page 2025
-
[44]
Analytical Techniques for Electrically Active Defect Detection
Eddy Simoen, Johan Lauwaert, and Henk Vrielinck. “Analytical Techniques for Electrically Active Defect Detection”. In: 2015, pp. 205–250. doi: 10.1016/bs. semsem.2014.12.001
work page doi:10.1016/bs 2015
-
[45]
Emerging inorganic compound thin film photovoltaic ma- terials: Progress, challenges and strategies
Fangyang Liu et al. “Emerging inorganic compound thin film photovoltaic ma- terials: Progress, challenges and strategies”. In: Materials Today 41 (Dec. 2020), pp. 120–142. issn: 13697021. doi: 10.1016/j.mattod.2020.09.002
-
[46]
Sudhanshu Shukla et al. “Carrier recombination mechanism and photovoltage deficit in 1.7-eV band gap near-stoichiometric Cu(In,Ga)S2”. In: Physical Re- view Materials 5.5 (May 2021), p. 055403. issn: 2475-9953. doi: 10 . 1103 / PhysRevMaterials.5.055403
work page 2021
-
[47]
Peter W¨ urfel. Physics of Solar Cells . Wiley, Jan. 2005. isbn: 9783527404285. doi: 10.1002/9783527618545
-
[48]
Statistics of the Recombinations of Holes and Electrons
W. Shockley and W. T. Read. “Statistics of the Recombinations of Holes and Electrons”. In: Physical Review 87.5 (Sept. 1952), pp. 835–842.issn: 0031-899X. doi: 10.1103/PhysRev.87.835
-
[49]
Basita Das et al. “What is a deep defect? Combining Shockley-Read-Hall statis- tics with multiphonon recombination theory”. In:Physical Review Materials 4.2 (Feb. 2020), p. 024602. issn: 2475-9953. doi: 10.1103/PhysRevMaterials.4. 024602
-
[50]
M Kaminska. “EL2 Defect in GaAs”. In: Physica Scripta T19B (Jan. 1987), pp. 551–557. issn: 0031-8949. doi: 10.1088/0031-8949/1987/T19B/038
-
[51]
Maria Kaminska and Eicke R. Weber. “Chapter 2 EL2 Defect in GaAs”. In: 1993, pp. 59–89. doi: 10.1016/S0080-8784(08)62798-2
-
[52]
Identification of the 0.82-eV electron trap, EL2 in GaAs, as an isolated antisite arsenic defect
M. Kami´ nska, M. Skowro´ nski, and W. Kuszko. “Identification of the 0.82-eV electron trap, EL2 in GaAs, as an isolated antisite arsenic defect”. In: Physical Review Letters 55.20 (Nov. 1985), pp. 2204–2207. issn: 0031-9007. doi: 10 . 1103/PhysRevLett.55.2204. 32
work page 1985
-
[53]
GaAs MMIC Reliability Assurance Guideline for Space Applications
Sammy Kayali, George Ponchak, and Roland Shaw. “GaAs MMIC Reliability Assurance Guideline for Space Applications”. In: 96.25 (1997)
work page 1997
-
[54]
Metastability of the Isolated Arsenic-Antisite Defect in GaAs
D. J. Chadi and K. J. Chang. “Metastability of the Isolated Arsenic-Antisite Defect in GaAs”. In: Physical Review Letters 60.21 (May 1988), pp. 2187–2190. issn: 0031-9007. doi: 10.1103/PhysRevLett.60.2187
-
[55]
Jaroslaw Dabrowski and Matthias Scheffler. “Theoretical Evidence for an Opti- cally Inducible Structural Transition of the Isolated As Antisite in GaAs: Iden- tification and Explanation of EL2?” In: Physical Review Letters 60.21 (May 1988), pp. 2183–2186. issn: 0031-9007. doi: 10.1103/PhysRevLett.60.2183
-
[56]
Temperature dependence of carrier capture by defects in gallium arsenide
William Wampler and Normand Modine. Temperature dependence of carrier capture by defects in gallium arsenide . Tech. rep. Albuquerque, NM, and Liv- ermore, CA (United States): Sandia National Laboratories (SNL), Aug. 2015. doi: 10.2172/1213029
-
[57]
W. Kohn and L. J. Sham. “Self-Consistent Equations Including Exchange and Correlation Effects”. In: Physical Review 140.4A (Nov. 1965), A1133–A1138. issn: 0031-899X. doi: 10.1103/PhysRev.140.A1133
-
[58]
Hybrid functionals based on a screened Coulomb potential
Jochen Heyd, Gustavo E. Scuseria, and Matthias Ernzerhof. “Hybrid functionals based on a screened Coulomb potential”. In: The Journal of Chemical Physics 118.18 (May 2003), pp. 8207–8215. issn: 0021-9606. doi: 10.1063/1.1564060
-
[59]
First-principles characterization of native defects and oxygen impurities in GaAs
Khang Hoang. “First-principles characterization of native defects and oxygen impurities in GaAs”. In: arXiv (June 2025)
work page 2025
-
[60]
Nonrad: Computing nonradiative capture coefficients from first principles
Mark E. Turiansky et al. “Nonrad: Computing nonradiative capture coefficients from first principles”. In: Computer Physics Communications 267 (Oct. 2021), p. 108056. issn: 00104655. doi: 10.1016/j.cpc.2021.108056
-
[61]
First-principles theory of nonradiative carrier capture via multiphonon emission
Audrius Alkauskas, Qimin Yan, and Chris G. Van de Walle. “First-principles theory of nonradiative carrier capture via multiphonon emission”. In: Physi- cal Review B 90.7 (Aug. 2014), p. 075202. issn: 1098-0121. doi: 10 . 1103 / PhysRevB.90.075202
work page 2014
-
[62]
A. M. Stoneham. Theory of Defects in Solids . Oxford University Press, Feb
-
[63]
isbn: 9780198507802. doi: 10.1093/acprof:oso/9780198507802.001. 0001
-
[64]
Jiqiang Li et al. “Effective and Noneffective Recombination Center Defects in Cu2ZnSnS4: Significant Difference in Carrier Capture Cross Sections”. In: Chemistry of Materials 31.3 (Feb. 2019), pp. 826–833. issn: 0897-4756. doi: 10.1021/acs.chemmater.8b03933
-
[65]
III–V multijunction solar cells for concentrating photo- voltaics
Hector Cotal et al. “III–V multijunction solar cells for concentrating photo- voltaics”. In: Energy Environ. Sci. 2.2 (2009), pp. 174–192. issn: 1754-5692. doi: 10.1039/B809257E. 33
-
[66]
GaAs photovoltaics and optoelectronics using releasable multilayer epitaxial assemblies
Jongseung Yoon et al. “GaAs photovoltaics and optoelectronics using releasable multilayer epitaxial assemblies”. In: Nature 465.7296 (May 2010), pp. 329–333. issn: 0028-0836. doi: 10.1038/nature09054
-
[67]
M. Merrick et al. “Photoluminescence of InNAs alloys: S-shaped temperature dependence and conduction-band nonparabolicity”. In: Physical Review B 76.7 (Aug. 2007), p. 075209. issn: 1098-0121. doi: 10.1103/PhysRevB.76.075209
-
[68]
M. Latkowska et al. “Temperature dependence of photoluminescence from In- NAsSb layers: The role of localized and free carrier emission in determination of temperature dependence of energy gap”. In: Applied Physics Letters 102.12 (Mar. 2013). issn: 0003-6951. doi: 10.1063/1.4798590
-
[69]
Optical gate realization with thin CdS films
B. Ullrich, C. Bouchenaki, and S. Roth. “Optical gate realization with thin CdS films”. In: Applied Physics A Solids and Surfaces 53.6 (Dec. 1991), pp. 539–546. issn: 0721-7250. doi: 10.1007/BF00331543
-
[70]
Chapter 4 Photoluminescence I: Theory
H.Barry Bebb and E.W. Williams. “Chapter 4 Photoluminescence I: Theory”. In: 1972, pp. 181–320. doi: 10.1016/S0080-8784(08)62345-5
-
[71]
Peter Y. Yu and Manuel Cardona. Fundamentals of Semiconductors . Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. isbn: 978-3-642-00709-5. doi: 10. 1007/978-3-642-00710-1
work page 2010
-
[72]
Shallow Impurity States in Silicon and Germanium
W. Kohn. “Shallow Impurity States in Silicon and Germanium”. In: 1957, pp. 257–320. doi: 10.1016/S0081-1947(08)60104-6
-
[73]
Semiconductors and Semimetals Vol 10: Transport Phenomena
C Hilsum. “Semiconductors and Semimetals Vol 10: Transport Phenomena”. In: Physics Bulletin 27.2 (1976). issn: 0031-9112. doi: 10.1088/0031-9112/ 27/2/034
-
[74]
Ab initio molecular dynamics for liquid metals
G. Kresse and J. Hafner. “Ab initio molecular dynamics for liquid metals”. In: Physical Review B 47.1 (Jan. 1993), pp. 558–561. issn: 0163-1829. doi: 10.1103/PhysRevB.47.558
-
[75]
G. Kresse and J. Furthm¨ uller. “Efficiency of ab-initio total energy calculations for metals and semiconductors using a plane-wave basis set”. In: Physical Re- view B 54.16 (Oct. 1996), pp. 11169–11186. issn: 0163-1829. doi: 10.1103/ PhysRevB.54.11169
work page 1996
-
[76]
PyCDT: A Python toolkit for modeling point defects in semiconductors and insulators
Danny Broberg et al. “PyCDT: A Python toolkit for modeling point defects in semiconductors and insulators”. In: Computer Physics Communications 226 (May 2018), pp. 165–179. issn: 00104655. doi: 10.1016/j.cpc.2018.01.004
-
[77]
Insights into oxygen vacancies from high-throughput first-principles calculations
Yu Kumagai et al. “Insights into oxygen vacancies from high-throughput first-principles calculations”. In: Physical Review Materials 5.12 (Dec. 2021), p. 123803. issn: 2475-9953. doi: 10.1103/PhysRevMaterials.5.123803
-
[78]
Electrostatics-based finite-size corrections for first-principles point defect calculations
Yu Kumagai and Fumiyasu Oba. “Electrostatics-based finite-size corrections for first-principles point defect calculations”. In: Physical Review B 89.19 (May 2014), p. 195205. issn: 1098-0121. doi: 10.1103/PhysRevB.89.195205. 34
-
[79]
Role of excited states in Shockley-Read-Hall recom- bination in wide-band-gap semiconductors
Audrius Alkauskas et al. “Role of excited states in Shockley-Read-Hall recom- bination in wide-band-gap semiconductors”. In: Physical Review B 93.20 (May 2016), p. 201304. issn: 2469-9950. doi: 10.1103/PhysRevB.93.201304
-
[80]
J. Buckeridge. “Equilibrium point defect and charge carrier concentrations in a material determined through calculation of the self-consistent Fermi energy”. In: Computer Physics Communications 244 (Nov. 2019), pp. 329–342. issn: 00104655. doi: 10.1016/j.cpc.2019.06.017
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