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Quantum device fine-tuning using unsupervised embedding learning

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arxiv 2001.04409 v1 pith:KX4LRKGP submitted 2020-01-13 cond-mat.mes-hall cs.LGquant-ph

Quantum device fine-tuning using unsupervised embedding learning

classification cond-mat.mes-hall cs.LGquant-ph
keywords devicefine-tuninggateparametersquantumalgorithmscoreunsupervised
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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Quantum devices with a large number of gate electrodes allow for precise control of device parameters. This capability is hard to fully exploit due to the complex dependence of these parameters on applied gate voltages. We experimentally demonstrate an algorithm capable of fine-tuning several device parameters at once. The algorithm acquires a measurement and assigns it a score using a variational auto-encoder. Gate voltage settings are set to optimise this score in real-time in an unsupervised fashion. We report fine-tuning times of a double quantum dot device within approximately 40 min.

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